Patents by Inventor Mrinal Mathur

Mrinal Mathur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210176159
    Abstract: A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.
    Type: Application
    Filed: February 23, 2021
    Publication date: June 10, 2021
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Patent number: 10965578
    Abstract: A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: March 30, 2021
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Patent number: 10581719
    Abstract: A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: March 3, 2020
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20190273675
    Abstract: A hardware architecture for a universal testing system used for performing tests on cable modem devices (OUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.
    Type: Application
    Filed: May 17, 2019
    Publication date: September 5, 2019
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20190260664
    Abstract: A hardware architecture for a universal testing system used for performing Wfi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.
    Type: Application
    Filed: May 1, 2019
    Publication date: August 22, 2019
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20190190625
    Abstract: A universal testing system platform with a modular and symmetrical design that provides faraday cages in a flexible, efficient and space saving architecture for testing wireless devices.
    Type: Application
    Filed: February 22, 2019
    Publication date: June 20, 2019
    Inventors: Samant Kumar, Shivashankar Diddimani, James Christopher Collip, Mrinal Mathur, Hemanth Nekkileru, Naresh Chandra Nigam
  • Patent number: 10320651
    Abstract: A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: June 11, 2019
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Patent number: 10277497
    Abstract: A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: April 30, 2019
    Assignee: Contec, LLC
    Inventors: Rajeev Tiwari, Mrinal Mathur
  • Patent number: 10158553
    Abstract: A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: December 18, 2018
    Assignee: Contec, LLC
    Inventors: Rajeev Tiwari, Mrinal Mathur
  • Publication number: 20180076908
    Abstract: A universal testing system platform with a modular and symmetrical design that provides faraday cages in a flexible, efficient and space saving architecture for testing wireless devices.
    Type: Application
    Filed: November 21, 2017
    Publication date: March 15, 2018
    Inventors: Samant Kumar, Shivashankar Diddimani, James Christopher Collip, Mrinal Mathur, Hemanth Chandra Nekkileru, Naresh Chandra Nigam
  • Patent number: 9900113
    Abstract: A universal testing system platform with a modular and symmetrical design that provides a flexible, efficient and space saving architecture for testing wireless devices is disclosed.
    Type: Grant
    Filed: February 29, 2016
    Date of Patent: February 20, 2018
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20170289012
    Abstract: A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.
    Type: Application
    Filed: June 16, 2017
    Publication date: October 5, 2017
    Inventors: Rajeev Tiwari, Mrinal Mathur
  • Publication number: 20170250762
    Abstract: A universal testing system platform with a modular and symmetrical design that provides a flexible, efficient and space saving architecture for testing wireless devices is disclosed.
    Type: Application
    Filed: February 29, 2016
    Publication date: August 31, 2017
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20170126537
    Abstract: A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.
    Type: Application
    Filed: October 30, 2015
    Publication date: May 4, 2017
    Applicant: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20170126536
    Abstract: A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.
    Type: Application
    Filed: October 30, 2015
    Publication date: May 4, 2017
    Applicant: Contec, LLC
    Inventors: Samant Kumar, Shivashankar Diddimani, Hemanth Nekkileru, James Christopher Collip, Naresh Chandra Nigam, Mrinal Mathur
  • Publication number: 20170126539
    Abstract: A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.
    Type: Application
    Filed: November 10, 2016
    Publication date: May 4, 2017
    Applicant: Contec, LLC
    Inventors: Rajeev Tiwari, Mrinal Mathur