Abstract: An accelerator controller comprises a detector and a loader. The detector detects runtime features of an application or a virtual machine and identifies an accelerator logic associated with the application or the virtual machine corresponding to the detected runtime features. The loader loads the identified accelerator logic into at least one dynamic random access memory (DRAM). The at least one DRAM array is selectively reconfigurable to behave like a look-up table (LUT) or to behave like a DRAM memory array based on the identified accelerator logic, and the at least one DRAM array is in a cache-coherent address space of the operating system environment. The accelerator logic may comprise a look-up table (LUT).

Abstract: A hybrid memory module includes a dynamic random access memory (DRAM) cache, a flash storage, and a memory controller. The DRAM cache includes one or more DRAM devices and a DRAM controller, and the flash storage includes one or more flash devices and a flash controller. The memory controller interfaces with the DRAM controller and the flash controller.

Abstract: A memory system includes a master controller, an interface with a host computer, and a link bus configured to couple with a slave controller. The master controller includes an address mapping decoder, a transaction queue, and a scheduler. The address mapping decoder is configured to decode address mapping information of a memory device coupled to the slave controller. The scheduler of the master controller is configured to reorder memory transaction requests received from the host computer in the transaction queue using the address mapping information of the memory device. The memory system employs an extended open page policy based on the pending memory transaction requests in the transaction queue of the master controller.

Abstract: A memory (1205) is disclosed. The memory (1205) can includes a stack of dynamic Random Access Memory (DRAM) cores (1210, 1215, 1220, 1225) in a three-dimensional stacked memory architecture (1230). Each of the DRAM cores (1210, 1215, 1220, 1225) can include a plurality of banks (205-1, 205-2, 205-3, 205-4) to store data. The memory (1205) can also include logic layer (1235) which can include an interface (1305) to connect the memory (1205) with a processor (120). The logic layer (1235) can also include a refresh engine (115) that can be used to refresh one of the plurality of banks (205-1, 205-2, 205-3, 205-4) and a Smart Refresh Component (305) that can advise the refresh engine (115) which bank to refresh using an out-of-order per-bank refresh. The Smart Refresh Component (305) can use a logic (415) to identify a farthest bank in the pending transactions in the transaction queue (430) at the time of refresh.

Abstract: A dynamic Random Access Memory (DRAM) module (105) is disclosed. The DRAM module (105) can includes a plurality of banks (205-1, 205-2, 205-3, 205-4) to store data and a refresh engine (115) that can be used to refresh one of the plurality of banks (205-1, 205-2, 205-3, 205-4). The DRAM module (105) can also include a Smart Refresh Component (305) that can advise the refresh engine (115) which bank to refresh using an out-of-order per-bank refresh. The Smart Refresh Component (305) can use a logic (415) to identify a farthest bank in the pending transactions in the transaction queue (430) at the time of refresh.

Abstract: A dynamic Random Access Memory (DRAM) module (105) is disclosed. The DRAM module (105) can includes a plurality of banks (205-1, 205-2, 205-3, 205-4) to store data and a refresh engine (115) that can be used to refresh one of the plurality of banks (205-1, 205-2, 205-3, 205-4). The DRAM module (105) can also include a Smart Refresh Component (305) that can advise the refresh engine (115) which bank to refresh using an out-of-order per-bank refresh. The Smart Refresh Component (305) can use a logic (415) to identify a farthest bank in the pending transactions in the transaction queue (430) at the time of refresh.

Abstract: A Solid State Drive (SSD) is disclosed. The SSD can include a host interface logic, a data input buffer, a data output buffer, and a buffer manager to manage the data input buffer and data output buffer. A re-order logic can advise the buffer manager about which data should be returned to the host computer from the data output buffer.

Abstract: A memory module (735) can include a memory array (105) and a memory controller (740). The memory controller (740) can include a status register (745) that specifies whether the memory module (735) is operating at normal power or low power. A normal reliability region (305, 505) and a low reliability region (310, 510) can be defined in the memory array (105), based on the power level specified by the status register (745).

Abstract: The invention relates to a dual-threshold-voltage two-port sub-threshold SRAM cell apparatus. The above-mentioned apparatus comprises a first inverter, a second inverter, an access transistor and a read buffer. The first inverter and the second inverter include a plurality of first operating elements and a plurality of second operating elements for storing data. The access transistor is coupled to the first inverter and the second inverter, wherein the first operating elements and the second operating elements are high threshold voltage operating elements and the access transistor is low threshold voltage operating transistor. The read buffer is used for performing a read operation.

Abstract: The invention relates to a dual-threshold-voltage two-port sub-threshold SRAM cell apparatus. The above-mentioned apparatus comprises a first inverter, a second inverter, an access transistor and a read buffer. The first inverter and the second inverter include a plurality of first operating elements and a plurality of second operating elements for storing data. The access transistor is coupled to the first inverter and the second inverter, wherein the first operating elements and the second operating elements are high threshold voltage operating elements and the access transistor is low threshold voltage operating transistor. The read buffer is used for performing a read operation.