Abstract: According to one implementation of the present disclosure, a circuit structure is configured to store charge in a charge-based storage element, where the charge-based storage element is disposed at least partially in a shallow-trench-isolation (STI) region of the circuit. According to one implementation of the present disclosure, a method includes: providing a circuit structure disposed on a substrate and a shallow-trench-isolation (STI) region of a circuit; forming an opening of the substrate and the STI region by removing a portion of the substrate and STI region; placing a first liner material in the opening and on remaining portions of the substrate and the STI region; and depositing a first metal layer in the opening on the first liner material.

Abstract: Subject matter disclosed herein may relate to correlated electron switch devices, and may relate more particularly to voltage detection with correlated electron switch devices.