Patents by Inventor Muhamad Izzat BIN ROSLEE

Muhamad Izzat BIN ROSLEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200393511
    Abstract: An IC testing apparatus whereby a wedge body with inclined surfaces is attached to a bottom side of existing contact finger modules. The inclined support is then attached to the top of a load board of the testing apparatus. The inclined surfaces cause the normally horizontal finger modules to become inclined to the horizontal. In this manner, testing can be carried out in the usual way with existing contact finger modules, whilst the problems of IC device contact pad burr and oxidization are solved. Furthermore, because the outer, load board end of the contact fingers are also at an angle, these outer tips of the contact fingers naturally come into contact with the load board, without requiring any soldering.
    Type: Application
    Filed: June 11, 2020
    Publication date: December 17, 2020
    Applicant: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Eng Kiat LEE, Muhamad Izzat bin ROSLEE, Mei Chen CHIN
  • Patent number: 10826217
    Abstract: An electrical contact assembly having a pair of contacts mirroring each other, each contact coupled with an elastomer positioned in a recess formed near a lower end of the contact. Each elastomer has a cylindrical shape with the axis of the cylinder running in a front to rear direction. Each elastomer is secured at its front and rear ends by a lower cavity formed within a housing. The contacts are able to rock sideways around their lower ends between uncompressed and compressed states.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: November 3, 2020
    Assignee: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Wei Kuong Foong, Kok Sing Goh, Shamal Mundiyath, Eng Kiat Lee, Muhamad Izzat bin Roslee
  • Publication number: 20190267738
    Abstract: An electrical contact assembly having a pair of contacts mirroring each other, each contact coupled with an elastomer positioned in a recess formed near a lower end of the contact. Each elastomer has a cylindrical shape with the axis of the cylinder running in a front to rear direction. Each elastomer is secured at its front and rear ends by a lower cavity formed within a housing. The contacts are able to rock sideways around their lower ends between uncompressed and compressed states.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 29, 2019
    Applicant: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Eng Kiat LEE, Muhamad Izzat bin ROSLEE
  • Patent number: 9182424
    Abstract: A chip testing solution having two separate contacts: one to provide current and one to measure voltage. One contact acts as the force and other as sense, and with its unique short wipe stroke technology enables the electrical connection from the contact terminal of the device under test (DUT) to the loadboard without fail even after prolonged insertion/testing of the devices. The two contacts are in close proximity, but electrically isolated from each other. Each contact is made to electrically touch a single conductive lead/pad on the DUT thus forming a test connection. The two contacts; one on front and other on back, wiping on the lead/pads will generally be a “sense” probe, and a “force” used for making a Kelvin connection. The short contact is connected to the loadboard by means of an additional contact known as “interposer” extending through and top of the tall contact base body.
    Type: Grant
    Filed: March 19, 2013
    Date of Patent: November 10, 2015
    Assignee: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Foong Wei Kuong, Goh Kok Sing, Shamal Mundiyath, Muhamad Izzat Bin Roslee
  • Publication number: 20130249583
    Abstract: A chip testing solution having two separate contacts: one to provide current and one to measure voltage. One contact acts as the force and other as sense, and with its unique short wipe stroke technology enables the electrical connection from the contact terminal of the device under test (DUT) to the loadboard without fail even after prolonged insertion/testing of the devices. The two contacts are in close proximity, but electrically isolated from each other. Each contact is made to electrically touch a single conductive lead/pad on the DUT thus forming a test connection. The two contacts; one on front and other on back, wiping on the lead/pads will generally be a “sense” probe, and a “force” used for making a Kelvin connection. The short contact is connected to the loadboard by means of an additional contact known as “interposer” extending through and top of the tall contact base body.
    Type: Application
    Filed: March 19, 2013
    Publication date: September 26, 2013
    Applicant: JF Microtechnology Sdn. Bhd.
    Inventors: Foong Wei KUONG, Goh Kok SING, Shamal MUNDIYATH, Muhamad Izzat BIN ROSLEE