Patents by Inventor Muhammed Taher Abu Saif

Muhammed Taher Abu Saif has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing of microscale to nanoscale thin films
    Patent number: 6817255
    Abstract: Apparatus and method for testing a thin film material. A chip is fabricated that includes the specimen to be tested, held by a force sensor beam at a first longitudinal end and by a support structure at a second longitudinal end. The chip is configured to be placed into a testing environment for quantitative and qualitative material property testing of the specimen. Methods are also provided for fabricating a testing chip.
    Type: Grant
    Filed: September 11, 2002
    Date of Patent: November 16, 2004
    Assignee: The Board of Trustees of the University of Illinois
    Inventors: Amanul Haque, Muhammed Taher Abu Saif
  • Apparatus and method for testing of microscale to nanoscale thin films
    Publication number: 20030057993
    Abstract: Apparatus and method for testing a thin film material. A chip is fabricated that includes the specimen to be tested, held by a force sensor beam at a first longitudinal end and by a support structure at a second longitudinal end. The chip is configured to be placed into a testing environment for quantitative and qualitative material property testing of the specimen. Methods are also provided for fabricating a testing chip.
    Type: Application
    Filed: September 11, 2002
    Publication date: March 27, 2003
    Applicant: University of Illinois at Urbana
    Inventors: Amanul Haque, Muhammed Taher Abu Saif