Abstract: The present disclosure relates to a display panel and a display device using the same. The display panel includes: a plurality of data lines to which a data voltage is applied; a plurality of pixel driving voltage lines arranged parallel to the data lines, and to which a pixel driving voltage is applied; and a plurality of reference voltage lines overlapping the pixel driving voltage lines with an insulating layer disposed therebetween, arranged in parallel with the data lines, and to which a reference voltage lower than the pixel driving voltage is applied.

Abstract: The present disclosure relates to a display panel and a display device using the same. The display panel includes: a plurality of data lines to which a data voltage is applied; a plurality of pixel driving voltage lines arranged parallel to the data lines, and to which a pixel driving voltage is applied; and a plurality of reference voltage lines overlapping the pixel driving voltage lines with an insulating layer disposed therebetween, arranged in parallel with the data lines, and to which a reference voltage lower than the pixel driving voltage is applied.

Abstract: A display panel includes a first metal layer; a first insulating layer covering the first metal layer; a semiconductor layer disposed on the first insulating layer; a second insulating layer disposed on the first insulating layer to cover the semiconductor layer; and a second metal layer disposed on the second insulating layer, wherein the first metal layer comprises a bottom gate electrode of a driving element, wherein the second metal layer comprises a top gate electrode of the driving element connected to the bottom gate electrode through a first contact hole penetrating the second insulating layer and the first insulating layer, wherein the semiconductor layer comprises a semiconductor channel of the driving element overlapping with the top gate electrode and the bottom gate electrode.

Abstract: A method of inspecting the quality of an organic light-emitting diode (OLED) and an inspecting system for performing the method are disclosed. In one aspect, the method includes applying an input voltage to the OLED, measuring an OLED voltage across the OLED and an OLED current flowing through the OLED, estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current, and extracting a physical characteristic of the OLED based at least in part on the parameter.

Abstract: A method of inspecting the quality of an organic light-emitting diode (OLED) and an inspecting system for performing the method are disclosed. In one aspect, the method includes applying an input voltage to the OLED, measuring an OLED voltage across the OLED and an OLED current flowing through the OLED, estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current, and extracting a physical characteristic of the OLED based at least in part on the parameter.