Patents by Inventor Munehiro NOGUCHI

Munehiro NOGUCHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical characteristic measurement system and calibration method for optical characteristic measurement system
    Patent number: 10422694
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Optical characteristic measurement system and calibration method for optical characteristic measurement system
    Patent number: 10422695
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM
    Publication number: 20190170578
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM
    Publication number: 20190170577
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Optical characteristic measurement system and calibration method for optical characteristic measurement system
    Patent number: 10222261
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: March 5, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM
    Publication number: 20170010214
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: July 1, 2016
    Publication date: January 12, 2017
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI