Patents by Inventor Munetoshi Imada

Munetoshi Imada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tire defect detection method
    Patent number: 9036893
    Abstract: Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S1, two-dimensional images including a slit light image are successively obtained in advance. In Step S1, a slit light image is extracted from data of a plurality of shot two-dimensional images. In Step S2, an eccentricity component which is deviation resulting from eccentricity is eliminated from the extracted slit light image. In Step S3, a feature quantity is calculated based on the light image from which the eccentricity component is eliminated, and in Step S4, a thinly extending convex defect is detected based on the calculated feature quantity.
    Type: Grant
    Filed: May 17, 2012
    Date of Patent: May 19, 2015
    Assignees: Sharp Kabushiki Kaisha, Toyo Tire & Rubber Co., Ltd.
    Inventors: Munetoshi Imada, Hirokatsu Mizukusa, Toshihiko Iwatani, Hiroyasu Koshimizu, Takayuki Fujiwara
  • TIRE DEFECT DETECTION METHOD
    Publication number: 20140086453
    Abstract: Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S1, two-dimensional images including a slit light image are successively obtained in advance. In Step S1, a slit light image is extracted from data of a plurality of shot two-dimensional images. In Step S2, an eccentricity component which is deviation resulting from eccentricity is eliminated from the extracted slit light image. In Step S3, a feature quantity is calculated based on the light image from which the eccentricity component is eliminated, and in Step S4, a thinly extending convex defect is detected based on the calculated feature quantity.
    Type: Application
    Filed: May 17, 2012
    Publication date: March 27, 2014
    Applicants: TOYO TIRE & RUBBER CO. LTD., SHARP KABUSHIKI KAISHA
    Inventors: Munetoshi Imada, Hirokatsu Mizukusa, Toshihiko Iwatani, Hiroyasu Koshimizu, Takayuki Fujiwara