Patents by Inventor Muneyoshi Kobashi

Muneyoshi Kobashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7075294
    Abstract: In the method of inspecting a thin-film magnetic head, a thin-film magnetic head provided with a magnetoresistive film having a free layer whose magnetization direction changes depending on an external magnetic field and ferromagnetic layers for applying a bias magnetic field to the free layer is prepared. Then, a DC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Subsequently, an AC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Thereafter, an external magnetic field is applied to the magnetoresistive film while supplying a current thereto, and a property of the thin-film magnetic head such as asymmetry and reproducing output is inspected.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: July 11, 2006
    Assignees: TDK Corporation, SAE Magnetics (H.K.) Ltd.
    Inventors: Hiroki Matsukuma, Muneyoshi Kobashi
  • Publication number: 20050141138
    Abstract: A suspension includes a resilient flexure for adhering and supporting a head slider that has at least one head element, a load beam that supports said flexure, and a FPC member independently formed and fixed to the flexure and the load beam, having a plurality of connection pads electrically connected to the at least one head element and a plurality of trace conductors. One ends of the trace conductors are electrically connected to the plurality of connection pads, respectively. The FPC member has at least one slot formed at its face to which the head slider is adhered and located near the plurality of connection pads.
    Type: Application
    Filed: December 23, 2004
    Publication date: June 30, 2005
    Inventors: Masashi Shiraishi, Muneyoshi Kobashi, Hiroyoshi Nakajima
  • Publication number: 20050073300
    Abstract: In the method of inspecting a thin-film magnetic head, a thin-film magnetic head provided with a magnetoresistive film having a free layer whose magnetization direction changes depending on an external magnetic field and ferromagnetic layers for applying a bias magnetic field to the free layer is prepared. Then, a DC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Subsequently, an AC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Thereafter, an external magnetic field is applied to the magnetoresistive film while supplying a current thereto, and a property of the thin-film magnetic head such as asymmetry and reproducing output is inspected.
    Type: Application
    Filed: August 17, 2004
    Publication date: April 7, 2005
    Applicants: TDK CORPORATION, SAE MAGNETICS (H.K.) LTD.
    Inventors: Hiroki Matsukuma, Muneyoshi Kobashi