Abstract: Methods and apparatus for interactive built-in self-testing with user-programmable test patterns are disclosed. The present invention operates in the context of an integrated circuit (IC) including built-in self-test (BIST) logic and a test interface circuit resident on the IC. The BIST logic executes a BIST routine for testing the IC, and the test interface achieves the inputting of an external test pattern into the BIST logic from an external logic circuit. The test interface includes a first flag storage element accessible to the BIST logic. The first flag storage element stores a first flag that indicates whether the test pattern will be provided to the IC from the external logic. A test data storage element in the test interface stores the external test pattern, and is also accessible to the BIST logic. A second flag storage element accessible to the BIST logic stores a second flag to indicate whether the test pattern is available in the test data storage element.