Abstract: Systems and methods for device monitoring. The method may include obtaining first measurement data relating to one or more first operating parameters of a target device, obtaining a correlation model corresponding to the target device, and predicting, based on the first measurement data and the correlation model, second measurement data relating to the one or more second operating parameters of the target device. The correlation model may be generated based on first sample measurement data relating to the one or more first operating parameters and one or more second operating parameters of a reference device. The reference device may be of a same type of device as the target device and equipped with one or more additional sensors compared with the target device, the one or more additional sensors being configured for collecting the first sample measurement data relating to the one or more second operating parameters.

Abstract: A light transmittance measuring apparatus includes a housing made of opaque material, a light source device disposed in the housing and for emitting a first light beam and a second light beam to the object, a light sensor and a microcontroller. The first light beam and the second light beam have different wavelength ranges and have a first light intensity value and a second light intensity value, respectively. The light sensor is for sensing the first and second light beams after passing through the object and obtaining a third and fourth light intensity values, respectively. The microcontroller is for comparing the first and third light intensity values to obtain the light transmittance of the object under the first light beam and compare the second and fourth light intensity values to obtain the light transmittance of the object under the second light beam.

Abstract: A light transmittance measuring apparatus includes a housing made of opaque material, a light source device disposed in the housing and for emitting a first light beam and a second light beam to the object, a light sensor and a microcontroller. The first light beam and the second light beam have different wavelength ranges and have a first light intensity value and a second light intensity value, respectively. The light sensor is for sensing the first and second light beams after passing through the object and obtaining a third and fourth light intensity values, respectively. The microcontroller is for comparing the first and third light intensity values to obtain the light transmittance of the object under the first light beam and compare the second and fourth light intensity values to obtain the light transmittance of the object under the second light beam.