Patents by Inventor MUSTANSIR M. PRATAPGARHWALA

MUSTANSIR M. PRATAPGARHWALA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240111343
    Abstract: A method for configuring a processor includes identifying a component cooling device thermally coupled to a processor, and configuring one or more operating parameters of the processor based on the identification of the component cooling device.
    Type: Application
    Filed: September 29, 2022
    Publication date: April 4, 2024
    Inventors: MUSTANSIR M. PRATAPGARHWALA, CHRISTOPHER M. JAGGERS, CHRISTOPHER M. HELBERG
  • Publication number: 20240114658
    Abstract: An apparatus for component cooling includes a first heat transfer element configured to be thermally coupled to a heat-generating electronic component, and a second heat transfer element. The apparatus further includes a plurality of heat transfer paths thermally coupled between the first heat transfer element and the second heat transfer element. Each of the plurality of heat transfer paths configured to provide a separate heat conduction path from the first heat transfer element to the second heat transfer element. The apparatus further includes a manifold including a first fluid passage providing a first portion of a heat transfer fluid in thermal contact with the first heat transfer element, and a second fluid passage providing a second portion of the heat transfer fluid in thermal contact with the second heat transfer element.
    Type: Application
    Filed: September 29, 2022
    Publication date: April 4, 2024
    Inventors: CHRISTOPHER M. HELBERG, CHRISTOPHER M. JAGGERS, ROBERT EDWARD RADKE, MUSTANSIR M. PRATAPGARHWALA, MICHAEL J. AUSTIN, SUKESH SHENOY
  • Patent number: 11436114
    Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
    Type: Grant
    Filed: July 19, 2021
    Date of Patent: September 6, 2022
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Amitabh Mehra, Anil Harwani, William R. Alverson, Grant E. Ley, Jerry A. Ahrens, Mustansir M. Pratapgarhwala, Scott E. Swanstrom
  • Publication number: 20210349797
    Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
    Type: Application
    Filed: July 19, 2021
    Publication date: November 11, 2021
    Inventors: AMITABH MEHRA, ANIL HARWANI, WILLIAM R. ALVERSON, GRANT E. LEY, JERRY A. AHRENS, MUSTANSIR M. PRATAPGARHWALA, SCOTT E. SWANSTROM
  • Patent number: 11068368
    Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
    Type: Grant
    Filed: December 16, 2019
    Date of Patent: July 20, 2021
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Amitabh Mehra, Anil Harwani, William R. Alverson, Grant E. Ley, Jerry A. Ahrens, Mustansir M. Pratapgarhwala, Scott E. Swanstrom
  • Publication number: 20210182163
    Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
    Type: Application
    Filed: December 16, 2019
    Publication date: June 17, 2021
    Inventors: AMITABH MEHRA, ANIL HARWANI, WILLIAM R. ALVERSON, GRANT E. LEY, JERRY A. AHRENS, MUSTANSIR M. PRATAPGARHWALA, SCOTT E. SWANSTROM