Patents by Inventor Mustapha A. Abdulai

Mustapha A. Abdulai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Converged test platforms and processes for class and system testing of integrated circuits
    Patent number: 10677845
    Abstract: A testing system and process comprises a converged test platform for structural testing and system testing of an integrated circuit device. The testing system comprises a converged test platform supported by a baseboard of an automated test assembly. The converged test platform comprises a DUT socket for testing an integrated circuit device, at least one testing electronic component selectively electrically coupled to the DUT socket by at least one switch operable to electrically switch at least some testing signals between the automated testing assembly and the DUT socket to the at least one testing electronic component for both structural testing and system testing of the integrated circuit device within the same test flow. The switch(es) and testing electronic component(s) (e.g., an FPGA) can be reprogrammable for testing flexibility and faster through put. Associated processes and methods are provided for both class and system testing using the converged test platform for back-end and front-end testing.
    Type: Grant
    Filed: March 1, 2017
    Date of Patent: June 9, 2020
    Assignee: Intel Corporation
    Inventors: Abram M. Detofsky, Evan M. Fledell, Mustapha A. Abdulai, John M. Peterson, Dinia P. Kitendaugh, Pooya Tadayon, Jin Pan, David Shia
  • CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING OF INTEGRATED CIRCUITS
    Publication number: 20180252772
    Abstract: A testing system and process comprises a converged test platform for structural testing and system testing of an integrated circuit device. The testing system comprises a converged test platform supported by a baseboard of an automated test assembly. The converged test platform comprises a DUT socket for testing an integrated circuit device, at least one testing electronic component selectively electrically coupled to the DUT socket by at least one switch operable to electrically switch at least some testing signals between the automated testing assembly and the DUT socket to the at least one testing electronic component for both structural testing and system testing of the integrated circuit device within the same test flow. The switch(es) and testing electronic component(s) (e.g., an FPGA) can be reprogrammable for testing flexibility and faster through put. Associated processes and methods are provided for both class and system testing using the converged test platform for back-end and front-end testing.
    Type: Application
    Filed: March 1, 2017
    Publication date: September 6, 2018
    Applicant: Intel Corporation
    Inventors: Abram M. Detofsky, Evan M. Fledell, Mustapha A. Abdulai, John M. Peterson, Dinia P. Kitendaugh, Pooya Tadayon, Jin Pan, David Shia