Abstract: In a described example, a method includes using a power supply, supplying an output voltage that varies in response to a reference voltage; detecting a voltage ramp in an input reference voltage; generating an offset voltage waveform; adding the offset voltage waveform to the input reference voltage to generate a second reference voltage; and using the second reference voltage, operating the power supply to supply the output voltage.

Abstract: An integrated circuit (IC) is provided with functional logic having a plurality of internal signal lines and test logic. The test logic has a plurality of inputs coupled to the plurality of internal signal lines and with an output coupled to a first external pin of the integrated circuit. The test logic includes a buffer, and the test logic is configured to selectively couple each of the signals received on the plurality of signal lines either directly or via the buffer to the first external pin of the IC. The test logic is configured to selectively couple a signal received on a second external pin of the IC either directly or via the buffer to the first external pin of the IC in order to calibrate the buffer.

Abstract: A current detection system includes an inductor and a detection circuit coupled across the inductor. The inductor is configured to receive an input signal that includes an input current and generate a voltage across the inductor. The current detection circuit includes a sensing network and a transconductance amplifier. The sensing network includes a capacitor and is configured to monitor a voltage across the inductor. The transconductance amplifier is configured to receive a differential voltage indicative of a voltage drop across the capacitor and output a differential output current proportional to the differential voltage.

Abstract: A current detection system includes an inductor and a detection circuit coupled across the inductor. The inductor is configured to receive an input signal that includes an input current and generate a voltage across the inductor. The current detection circuit includes a sensing network and a transconductance amplifier. The sensing network includes a capacitor and is configured to monitor a voltage across the inductor. The transconductance amplifier is configured to receive a differential voltage indicative of a voltage drop across the capacitor and output a differential output current proportional to the differential voltage.

Abstract: A one-time programmable (OTP) circuit. The OTP circuit includes a non-volatile OTP memory disposed on a first circuit die. The OTP memory includes a floating gate terminal. The OTP circuit also includes a cross-coupled latch disposed on the first circuit die and coupled to the OTP memory and volatile memory input circuitry disposed on the first circuit die and coupled to the cross-coupled latch. The volatile memory input circuitry is configured to receive a test value and write the test value into the cross-coupled latch. The OTP circuit is configured to receive a programming command and store the test value in the OTP memory in response to receipt of the programming command.

Abstract: A current detection system includes an inductor and a detection circuit coupled across the inductor. The inductor is configured to receive an input signal that includes an input current and generate a voltage across the inductor. The current detection circuit includes a sensing network and a transconductance amplifier. The sensing network includes a capacitor and is configured to monitor a voltage across the inductor. The transconductance amplifier is configured to receive a differential voltage indicative of a voltage drop across the capacitor and output a differential output current proportional to the differential voltage.

Abstract: A control circuit for a DC-DC converter and a DC-DC converter are disclosed. The control circuit includes an integrator coupled to receive a first reference voltage and a first voltage that includes an output voltage for the DC-DC converter and to provide an integrated error signal. A first comparator is coupled to receive the first reference voltage and the first voltage and to provide a dynamic-integration signal that adjusts the integration time constant of the integrator.

Abstract: A voltage converter includes a high side power transistor coupled to an input voltage node and a low side power transistor coupled to the high side power transistor at a switch node. The switch node is configured to be coupled to an inductor. A slope detector circuit is configured to receive a signal indicative of a current through the inductor. The inductor current is a triangular waveform comprising a ramp-up phase and a ramp-down phase. The slope detector circuit also is configured to generate an output signal encoding when the inductor current is ramping up and when the inductor current is ramping down.

Abstract: In some embodiments, a resistor string digital to analog converter (DAC) comprises a first plurality of resistors disposed in a first column. Each of the first plurality of resistors couples to an output of the first column via one of a first plurality of switches. The DAC also comprises a second plurality of resistors disposed in a second column. Each of the second plurality of resistors couples to an output of the second column via one of a second plurality of switches. The second plurality of resistors is configured to couple in series with the first plurality of resistors. A first row selection signal is to control a first switch of the first plurality of switches and a second switch of the second plurality of switches. The first switch corresponds to a first resistor disposed at a top of the first column, and the second switch corresponds to a second resistor disposed at a bottom of the second column.

Abstract: An integrated circuit (IC) is provided with functional logic having a plurality of internal signal lines and test logic. The test logic has a plurality of inputs coupled to the plurality of internal signal lines and with an output coupled to a first external pin of the integrated circuit. The test logic includes a buffer, and the test logic is configured to selectively couple each of the signals received on the plurality of signal lines either directly or via the buffer to the first external pin of the IC. The test logic may be configured to selectively couple a signal received on a second external pin of the IC either via the buffer to the first external pin of the IC in order to calibrate the buffer.

Abstract: A one-time programmable (OTP) circuit. The OTP circuit includes a non-volatile OTP memory disposed on a first circuit die. The OTP memory includes a floating gate terminal. The OTP circuit also includes a cross-coupled latch disposed on the first circuit die and coupled to the OTP memory and volatile memory input circuitry disposed on the first circuit die and coupled to the cross-coupled latch. The volatile memory input circuitry is configured to receive a test value and write the test value into the cross-coupled latch. The OTP circuit is configured to receive a programming command and store the test value in the OTP memory in response to receipt of the programming command.

Abstract: In a described example, a method includes using a power supply, supplying an output voltage that varies in response to a reference voltage; detecting a voltage ramp in an input reference voltage; generating an offset voltage waveform; adding the offset voltage waveform to the input reference voltage to generate a second reference voltage; and using the second reference voltage, operating the power supply to supply the output voltage.

Abstract: An integrated circuit (IC) is provided with functional logic having a plurality of internal signal lines and test logic. The test logic has a plurality of inputs coupled to the plurality of internal signal lines and with an output coupled to a first external pin of the integrated circuit. The test logic includes a buffer, and the test logic is configured to selectively couple each of the signals received on the plurality of signal lines either directly or via the buffer to the first external pin of the IC. The test logic is configured to selectively couple a signal received on a second external pin of the IC either via the buffer to the first external pin of the IC in order to calibrate the buffer.

Abstract: An integrated circuit (IC) is provided with functional logic having a plurality of internal signal lines and test logic. The test logic has a plurality of inputs coupled to the plurality of internal signal lines and with an output coupled to a first external pin of the integrated circuit. The test logic includes a buffer, and the test logic is configured to selectively couple each of the signals received on the plurality of signal lines either directly or via the buffer to the first external pin of the IC. The test logic may be configured to selectively couple a signal received on a second external pin of the IC either via the buffer to the first external pin of the IC in order to calibrate the buffer.