Abstract: A semiconductor integrated circuit, able to repair a fault and normally operate as an overall circuit even when a fault occurs in a portion of the circuit, and able to reduce a change of signal delay along with the repair of the fault, including N (larger than 2) number of circuit modules which can replace each other's functions; circuit blocks each including R (larger than 1 but smaller than N) number of I/O units for outputting at least one signal to one circuit module, and receiving at least one signal generated in the one circuit module; and a circuit module selection unit configured to select R number of circuit modules from among the N number of circuit modules in response to a control signal, connect the selected R number of circuit modules and R number of I/O units of the circuit block in a 1:1 correspondence, and connect one circuit module selected from at least two circuit modules in response to the control signal to each of the R number of I/O units, and a method of producing the same.

Abstract: An image processing apparatus which can effectively use a storage circuit provided together with a logic circuit, perform high speed processing, and reduce the power consumption without causing a decline in the performance. The image processing system includes a DRAM for storing image data and a logic circuit, which are provided together on a semiconductor chip. The DRAM is divided into a plurality of DRAM modules, and the divided plurality of DRAM modules are arranged around a logic circuit portion for carrying out graphic drawing processing etc. When the ratio of valid data occupying bit lines in one access increases, the distances from the DRAM modules to the logic circuit portion become uniform, the length of the longest path interconnection can be made shorter comparing with the case of arrangement fixed in one direction, and the overall operating speed can be improved.