Patents by Inventor Mutsumi SUGANUMA

Mutsumi SUGANUMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing process monitoring apparatus
    Patent number: 11567482
    Abstract: A manufacturing process monitoring apparatus capable of determining a manufacturing process is anomaly, without requiring any threshold value for determining the as anomaly is provided.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: January 31, 2023
    Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
    Inventors: Tomoyuki Tezuka, Haruki Inami, Wataru Kameyama, Mutsumi Suganuma
  • MANUFACTURING PROCESS MONITORING APPARATUS
    Publication number: 20200159196
    Abstract: A manufacturing process monitoring apparatus capable of determining a manufacturing process is anomaly, without requiring any threshold value for determining the as anomaly is provided.
    Type: Application
    Filed: August 31, 2018
    Publication date: May 21, 2020
    Applicant: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
    Inventors: Tomoyuki TEZUKA, Haruki INAMI, Wataru KAMEYAMA, Mutsumi SUGANUMA
  • MANUFACTURING FACILITY ANOMALY DIAGNOSTIC DEVICE
    Publication number: 20180372583
    Abstract: There is provided a manufacturing facility anomaly diagnostic device that makes it possible to perform anomaly diagnosis of a manufacturing facility. The anomaly diagnostic device includes a feature value storage unit configured to hold information of a feature value that captures an operation state of a manufacturing facility, a data conversion unit configured to convert data, a feature value analysis unit configured to analyze the data converted by the data conversion unit, a data restoration unit configured to restore the data, an anomaly degree calculation unit configured to calculate an anomaly degree, and an anomaly diagnostic unit configured to perform anomaly diagnosis.
    Type: Application
    Filed: February 25, 2016
    Publication date: December 27, 2018
    Applicant: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
    Inventors: Tomoyuki TEZUKA, Hiroyuki SHINONAGA, Wataru KAMEYAMA, Mutsumi SUGANUMA, Motoki NAGASHIMA