Abstract: A controller includes a processor suitable for reading target data based on a predetermined main read voltage, and on each of a plurality of candidate read voltages having different voltage values; a memory suitable for storing main coded data and candidate coded data which are obtained by reading the target data; an ECC suitable for decoding the main coded data to generate main decoded data, and decoding each of the candidate coded data to generate candidate decoded data; and a counter suitable for counting the number of error bits corresponding to the main decoded data, and counting each of numbers of error bits corresponding to each of the candidate decoded data; and a voltage setting circuit suitable for setting a candidate read voltage having a minimum number of error bits, among the candidate decoded data, and which is smaller than the number of error bits corresponding to the main decoded data, as the main read voltage.

Abstract: A method for operating a data storage device includes determining appropriateness of a first read bias for adjacent target threshold voltage distributions among threshold voltage distributions for a plurality of memory cells; and if it is determined that the first read bias is inappropriate, determining a second read bias.

Abstract: An operating method of a memory system includes: reading a first data from a particular data group among a plurality of data groups included in a memory device; performing a first error correction code (ECC) decoding for the first data; when the first ECC decoding fails, reading a plurality of the remaining data other than the first data from the particular data group; performing a second ECC decoding for the plurality of the remaining data; when the second ECC decoding fails, identifying data, to which the second ECC decoding fails, among the plurality of the remaining data; obtaining first and second soft read values respectively corresponding to the first data, to which the first ECC decoding fails, and the second data, to which the second ECC decoding fails; determining reliability of the first and second data based on the first and second soft read values; and correcting the first data based on the reliability of the first and second data.

Abstract: A method for operating a data storage device includes determining appropriateness of a first read bias for adjacent target threshold voltage distributions among threshold voltage distributions for a plurality of memory cells; and if it is determined that the first read bias is inappropriate, determining a second read bias.

Abstract: A method for operating a data storage device includes determining appropriateness of a first read bias for adjacent target threshold voltage distributions among threshold voltage distributions for a plurality of memory cells; and if it is determined that the first read bias is inappropriate, determining a second read bias.

Abstract: A controller includes a processor suitable for reading target data based on a predetermined main read voltage, and on each of a plurality of candidate read voltages having different voltage values; a memory suitable for storing main coded data and candidate coded data which are obtained by reading the target data; an ECC suitable for decoding the main coded data to generate main decoded data, and decoding each of the candidate coded data to generate candidate decoded data; and a counter suitable for counting the number of error bits corresponding to the main decoded data, and counting each of numbers of error bits corresponding to each of the candidate decoded data; and a voltage setting circuit suitable for setting a candidate read voltage having a minimum number of error bits, among the candidate decoded data, and which is smaller than the number of error bits corresponding to the main decoded data, as the main read voltage.

Abstract: An operating method of a memory system includes: reading a first data from a particular data group among a plurality of data groups included in a memory device; performing a first error correction code (ECC) decoding for the first data; when the first ECC decoding fails, reading a plurality of the remaining data other than the first data from the particular data group; performing a second ECC decoding for the plurality of the remaining data; when the second ECC decoding fails, identifying data, to which the second ECC decoding fails, among the plurality of the remaining data; obtaining first and second soft read values respectively corresponding to the first data, to which the first ECC decoding fails, and the second data, to which the second ECC decoding fails; determining reliability of the first and second data based on the first and second soft read values; and correcting the first data based on the reliability of the first and second data.

Abstract: A data storage device includes a nonvolatile memory device including a plurality of memory cells; and a controller suitable for reading target data from a target page corresponding to the plurality of memory cells, estimating error bits of the target data based on reference data read from at least one reference page corresponding to the plurality of memory cells of the target data, and performing an error correction operation to the target data based on a result of the estimation.

Abstract: An operating method of a memory system includes: reading a first data from a particular data group among a plurality of data groups included in a memory device; performing a first error correction code (ECC) decoding for the first data; when the first ECC decoding fails, reading a plurality of the remaining data other than the first data from the particular data group; performing a second ECC decoding for the plurality of the remaining data; when the second ECC decoding fails, identifying data, to the second ECC decoding fails, among the plurality of the remaining data; obtaining first and second soft read values respectively corresponding to the first data, to which the first ECC decoding fails, and the second data, to which the second ECC decoding fails; determining reliability of the first and second data based on the first and second soft read values; and correcting the first data based on the reliability of the first and second data.

Abstract: A method for operating a data storage device includes determining appropriateness of a first read bias for adjacent target threshold voltage distributions among threshold voltage distributions for a plurality of memory cells; and if it is determined that the first read bias is inappropriate, determining a second read bias.

Abstract: A data storage device includes a nonvolatile memory device including a plurality of memory cells; and a controller suitable for reading target data from a target page corresponding to the plurality of memory cells, estimating error bits of the target data based on reference data read from at least one reference page corresponding to the plurality of memory cells of the target data, and performing an error correction operation to the target data based on a result of the estimation.

Abstract: A data storage device includes a memory device including a plurality of memory cells; and a controller suitable for determining, based on data read from the plurality of memory cells, section cell numbers corresponding to threshold voltage sections, and for determining an average threshold voltage of a threshold voltage distribution selected among a plurality of threshold voltage distributions of the memory cells which are estimated based on the section cell numbers, based on a Gaussian distribution function.

Abstract: An operating method of a memory system includes: reading a first data from a particular data group among a plurality of data groups included in a memory device; performing a first error correction code (ECC) decoding for the first data; when the first ECC decoding fails, reading a plurality of the remaining data other than the first data from the particular data group; performing a second ECC decoding for the plurality of the remaining data; when the second ECC decoding fails, identifying data, to the second ECC decoding fails among the plurality of the remaining data; obtaining first and second soft read values respectively corresponding to the first data, to which the first ECC decoding fails, and the second data, to which the second ECC decoding fails; determining reliability of the first and second data based on the first and second soft read values; and correcting the first data based on the reliability of the first and second data.

Abstract: A data storage device includes a memory device including a plurality of memory cells; and a controller suitable for determining, based on data read from the plurality of memory cells, section cell numbers corresponding to threshold voltage sections, and for determining an average threshold voltage of a threshold voltage distribution selected among a plurality of threshold voltage distributions of the memory cells which are estimated based on the section cell numbers, based on a Gaussian distribution function.

Abstract: An operating method of a memory controller includes performing a soft read operation to read data stored in a semiconductor memory device using a soft read voltage, performing a soft decision ECC decoding operation to the read data based on a first log likelihood ratio (LLR) value, and performing the soft decision ECC decoding operation to the read data based on a second LLR value when the soft decision ECC decoding operation based on the first LLR value fails. The first and second LLR values are selected between a default LLR value and an updated LLR value. The updated LLR value is generated on a basis of numbers of error bits and non-error bits of the read data, which are obtained through the soft decision ECC decoding operation to the read data.

Abstract: A data storage device includes a nonvolatile memory device including a target memory cell and one or more adjustment memory cells sharing bit lines with the target memory cell, one or more of the adjustment memory cell are adjacent memory cells adjacent to the target memory cells, and suitable for reading out data therefrom or storing data therein; and a controller suitable for adjusting threshold voltages of the adjustment memory cells based on threshold voltages it of the target memory cell and the adjacent memory cells.

Abstract: Provided is a data encoding method such that memory cells storing the data form a biased threshold voltage distribution. The data encoding method may include receiving N bits of first data, and converting the first data into M bits of second data, wherein the proportion of a first value in the second data is higher than the proportion of a second value.

Abstract: An operating method of a memory controller includes performing a soft read operation to read data stored in a semiconductor memory device using a soft read voltage, performing a soft decision ECC decoding operation to the read data based on a first log likelihood ratio (LLR) value, and performing the soft decision ECC decoding operation to the read data based on a second LLR value when the soft decision ECC decoding operation based on the first LLR value fails. The first and second LLR values are selected between a default LLR value and an updated LLR value. The updated LLR value is generated on a basis of numbers of error bits and non-error bits of the read data, which are obtained through the soft decision ECC decoding operation to the read data.

Abstract: A data encoding method may include receiving N bits of first data, and converting the first data into M bits of second data, wherein the proportion of a first value in the second data is higher than the proportion of a second value.

Abstract: A semiconductor memory apparatus includes: a first data counting unit configured to count respective programming levels of a plurality of input data and output a plurality of first data counting codes having a code value corresponding to the number of respective programming levels; a data read unit configured to sense data stored in a memory block having the plurality of input data programmed therein, based on a voltage level of a plurality of read bias signals, and output the sensed result as a plurality of output data; a second data counting unit configured to count respective programming levels of the plurality of output data and output a plurality of second data counting codes having a code value corresponding to the number of respective programming levels; a read bias control unit configured to compare the plurality of first data counting codes with the plurality of second data counting codes and output a bias control code having a code value corresponding to the comparison result; and a read bias genera