Abstract: A method of writing data in a memory comprising a NAND cell array is disclosed, wherein a data output device completes the writing process only by transmitting the data and a start address for writing the data to the memory.

Abstract: Provided are a non-volatile memory device, an electronic control system, and a method of operating the non-volatile memory device. A non-volatile memory device according to an embodiment of the present invention includes a first NAND cell array including a first group of pages, and a second NAND cell array including a second group of pages. A plurality of X-decoders are at least one-to-one connected to the first and second NAND cell arrays. A control logic controls the plurality of X-decoders to simultaneously sense data of a first page corresponding to a start address from among the first group of pages, and data of a second page subsequent to the first page from among the second group of pages.

Abstract: Provided are a non-volatile memory device, an electronic control system, and a method of operating the non-volatile memory device. A non-volatile memory device according to an embodiment of the present invention includes a first NAND cell array including a first group of pages, and a second NAND cell array including a second group of pages. A plurality of X-decoders are at least one-to-one connected to the first and second NAND cell arrays. A control logic controls the plurality of X-decoders to simultaneously sense data of a first page corresponding to a start address from among the first group of pages, and data of a second page subsequent to the first page from among the second group of pages.

Abstract: A method of writing data in a memory comprising a NAND cell array is disclosed, wherein a data output device completes the writing process only by transmitting the data and a start address for writing the data to the memory.

Abstract: A word line driving circuit includes a read voltage generator and a word line driver. The read voltage generator precharges a clamp capacitor with a power supply voltage to stably generate a read voltage in response to a read command. A capacitance of the clamp capacitor is varied to compensate for a fluctuation of a power supply voltage level. The word line driver distributes electric charges precharged in the clamp capacitor to a word line in response to a word line selecting signal. Therefore, the word line driving circuit reduces unnecessary power consumption in a standby mode by operating the word line rapidly with charge sharing in a read mode.

Abstract: Erasure methods for a nonvolatile memory cell that includes a gate electrode on a substrate, source and drain regions in the substrate at respective sides of the gate electrode, and a charge storage layer interposed between the gate electrode and the substrate. A nonzero first voltage is applied to the source region starting at a first time. While continuing to apply the first nonzero voltage to the source region, a second voltage having an opposite polarity to the first voltage is applied to the gate electrode starting at a second time later than the first time. The second voltage may increase in magnitude, e.g., stepwise, linearly and/or along a curve, after the second time.

Abstract: Erasure methods are provided for a nonvolatile memory cell that includes a gate electrode on a substrate, source and drain regions in the substrate at respective sides of the gate electrode, and a charge storage layer interposed between the gate electrode and the substrate. A nonzero first voltage is applied to the source region starting at a first time. While continuing to apply the first nonzero voltage to the source region, a second voltage having an opposite polarity to the first voltage is applied to the gate electrode starting at a second time later than the first time. The second voltage may increase in magnitude, e.g., stepwise, linearly and/or along a curve, after the second time.

Abstract: A word line driving circuit, which may include a read voltage generator and a word line driver. The read voltage generator may precharge a clamp capacitor with a power supply voltage to stably generate a read voltage in response to a read command. A capacitance of the clamp capacitor may be varied to compensate for a fluctuation of a power supply voltage level. The word line driver may distribute electric charges precharged in the clamp capacitor to a word line in response to a word line selecting signal. Therefore, the word line driving circuit may reduce unnecessary power consumption in a standby mode by operating the word line rapidly with charge sharing in a read mode.

Abstract: Provided are a program control circuit for flash memory devices and a control method utilizing such a circuit for controlling the bit line voltage level during programming operations for flash memory devices that include memory cells arranged in the form of a matrix, in which each of the memory cells is connected to a word line, a bit line, and a source line and which provides a program current to the bit line. The program control circuit includes a voltage level sensing control portion, a switching control portion, a current sink and a switching circuit. The voltage level sensing control portion is enabled or disabled in response to a first program control signal and compares the voltage of a bit line connected to a memory cell being programmed with a reference voltage and outputs a voltage control signal corresponding to the result of the comparison. The switching control portion outputs a switching bias signal in response to the voltage control signal and a second program control signal.

Abstract: Provided are a program control circuit for flash memory devices and a control method utilizing such a circuit for controlling the bit line voltage level during programming operations for flash memory devices that include memory cells arranged in the form of a matrix, in which each of the memory cells is connected to a word line, a bit line, and a source line and which provides a program current to the bit line. The program control circuit includes a voltage level sensing control portion, a switching control portion, a current sink and a switching circuit. The voltage level sensing control portion is enabled or disabled in response to a first program control signal and compares the voltage of a bit line connected to a memory cell being programmed with a reference voltage and outputs a voltage control signal corresponding to the result of the comparison. The switching control portion outputs a switching bias signal in response to the voltage control signal and a second program control signal.

Abstract: A sense amplifier enable signal generating circuit of a semiconductor memory device includes: a sense amplifier enable signal generating section for receiving an input signal externally applied, and generating a sense amplifier enable signal; a delay section for delaying the sense amplifier enable signal generated from the sense amplifier enable signal generating section; a detecting section for detecting the variation of a power supply voltage in accordance with a control signal externally applied, and generating a detection signal for the variation; a transfer section for transferring the delayed sense amplifier enable signal of the delay section in accordance with the detection signal generated from the detecting means; and an output section for receiving the sense amplifier enable signal generated from the sense amplifier enable signal generating means and the delayed sense amplifier enable signal of the delay section, and generating an output signal having a constant pulse width.