Patents by Inventor Myron Schnelder

Myron Schnelder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for using internal semiconductor junctions to aid in non-contact testing
    Publication number: 20070001688
    Abstract: Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.
    Type: Application
    Filed: June 29, 2006
    Publication date: January 4, 2007
    Inventors: Myron Schnelder, Eddie Williamson