Patents by Inventor Mysore Dinesh

Mysore Dinesh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for analyzing and identifying flaws in a manufactured part
    Publication number: 20050008213
    Abstract: A system and method for identifying flaws in a part being inspected includes generating a 3-d representation of the part, the 3-d representation comprising 3-d spatial coordinates corresponding to different locations on the part, and registering the 3-d spatial coordinates with corresponding locations of a part being inspected. An image of the part being inspected is generated, and a flaw in the part being inspected is identified from the generated image. A location of the flaw is correlated to a corresponding 3-d spatial coordinate, and a device is controlled to perform an operation on the part being inspected at the flaw location using information of the corresponding 3-d spatial coordinate.
    Type: Application
    Filed: July 9, 2003
    Publication date: January 13, 2005
    Inventors: Suneel Shankarappa, Gregory Mohr, Mysore Dinesh, Brian Lasiuk, Ronald McFarland, Elizabeth Dixon