Abstract: Provided is a device for ensembling data received from prediction devices and a method of operating the same. The device includes a data manager, a learner, and a predictor. The data manager receives first and second device prediction results from first and second prediction devices, respectively. The learner may adjust a weight group of a prediction model for generating first and second item weights, first and second device weights, based on the first and second device prediction results. The first and second item weights depend on first and second item values, respectively, of the first and second device prediction results. The first device weight corresponds to the first prediction device, and the second device weight corresponds to the second prediction device. The predictor generates an ensemble result of the first and second device prediction results, based on the first and second item weights and the first and second device weights.

Abstract: A programmable impedance control circuit for use in a semiconductor device having an impedance range shifting function prevents or substantially reduces an impedance detection failure based on an environment change. An impedance detector includes a first array driver, a second array driver, and an impedance matching transistor array and a range shifting transistor array independently controlled by the first and second array drivers. A comparator each compares first and second output voltage levels of the impedance detector with an array reference voltage, and outputs an up/down signal as the comparison result. A counter performs an up/down counting in response to the up/down signal, and outputs control code data. A range shifting circuit monitors a counting output of the counter and so generates range shifting data. Whereby, even if there is an environment change on a manufacturing process, power source voltage or operating temperature, etc.

Abstract: There is provided an output driver for use in a semiconductor device capable of remarkably improving linearity of impedance by reducing or minimizing a change of an impedance for output data caused due to a change of an external power supply. The output driver for outputting internal data of a semiconductor device to the exterior of a chip comprises a first driving section including a driving transistor to maintain an impedance for applied data at a certain level in response to the data; and a second driving section for compensating for linearity of the impedance in response to an operation signal from the driving transistor of the first driving section and providing an output terminal with the data.

Abstract: A programmable impedance controller and a method of operating to prevent or substantially reduce internal noise and an influence from external noise lasting for a long time. The programmable impedance controller for comparing a pad voltage of a pad connected to an external determination impedance with a reference voltage, and for outputting an impedance control signal, and for performing a digital coding to an impedance code corresponding to the impedance control signal, includes a clock controller and a counter. The clock controller outputs a first clock signal in a reset mode and outputs a second clock signal in an operating mode, in response to an applied clock signal. The counter sequentially updates code data, one code step per clock period, in response to the first clock signal in the reset mode, and outputs update code data. In an operating mode, the counter outputs the update code data updated in the reset mode in response to the second clock signal.

Abstract: A programmable impedance control circuit for use in a semiconductor device having an impedance range shifting function prevents or substantially reduces an impedance detection failure based on an environment change. An impedance detector includes a first array driver, a second array driver, and an impedance matching transistor array and a range shifting transistor array independently controlled by the first and second array drivers. A comparator each compares first and second output voltage levels of the impedance detector with an array reference voltage, and outputs an up/down signal as the comparison result. A counter performs an up/down counting in response to the up/down signal, and outputs control code data. A range shifting circuit monitors a counting output of the counter and so generates range shifting data. Whereby, even if there is an environment change on a manufacturing process, power source voltage or operating temperature, etc.

Abstract: There is provided an output driver for use in a semiconductor device capable of remarkably improving linearity of impedance by reducing or minimizing a change of an impedance for output data caused due to a change of an external power supply. The output driver for outputting internal data of a semiconductor device to the exterior of a chip comprises a first driving section including a driving transistor to maintain an impedance for applied data at a certain level in response to the data; and a second driving section for compensating for linearity of the impedance in response to an operation signal from the driving transistor of the first driving section and providing an output terminal with the data.