Patents by Inventor N R Girish

N R Girish has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11748871
    Abstract: Methods and systems for setting up alignment of a specimen are provided. One system includes computer subsystem(s) configured for acquiring two-dimensional (2D) images generated from output of a detector of an output acquisition subsystem at template locations in corresponding areas of printed instances on a specimen. The computer subsystem(s) determine offsets in x and y directions between the template locations using the 2D images and determine an angle of the specimen with respect to the output acquisition subsystem based on the offsets. If the angle is greater than a predetermined value, the computer subsystem(s) rotate the specimen and repeat the steps described above. If the angle is less than the predetermined value, the computer subsystem(s) store one of the 2D images for alignment of the specimen in a process performed on a specimen. The 2D images may include multi-mode images, which may be fused prior to determining the offsets.
    Type: Grant
    Filed: January 25, 2021
    Date of Patent: September 5, 2023
    Assignee: KLA Corp.
    Inventors: Xuguang Jiang, Tong Huang, N R Girish, Yiyu Zhang, Faisal Omer, Wei Kang, Ashok Varadarajan, Vadim Romanovski
  • Publication number: 20220101506
    Abstract: Methods and systems for setting up alignment of a specimen are provided. One system includes computer subsystem(s) configured for acquiring two-dimensional (2D) images generated from output of a detector of an output acquisition subsystem at template locations in corresponding areas of printed instances on a specimen. The computer subsystem(s) determine offsets in x and y directions between the template locations using the 2D images and determine an angle of the specimen with respect to the output acquisition subsystem based on the offsets. If the angle is greater than a predetermined value, the computer subsystem(s) rotate the specimen and repeat the steps described above. If the angle is less than the predetermined value, the computer subsystem(s) store one of the 2D images for alignment of the specimen in a process performed on a specimen. The 2D images may include multi-mode images, which may be fused prior to determining the offsets.
    Type: Application
    Filed: January 25, 2021
    Publication date: March 31, 2022
    Inventors: Xuguang Jiang, Tong Huang, N R Girish, Yiyu Zhang, Faisal Omer, Wei Kang, Ashok Varadarajan, Vadim Romanovski