Abstract: A computing system detects a defective object. An image is received of a manufacturing line that includes objects in a process of being manufactured. Each pixel included in the image is classified as a background pixel class, a non-defective object class, or a defective object class using a trained neural network model. The pixels included in the image that were classified as the non-defective object class or the defective object class are grouped into polygons. Each polygon is defined by a contiguous group of pixels classified as the non-defective object class or the defective object class. Each polygon is classified in the non-defective object class or in the defective object class based on a number of pixels included in a respective polygon that are classified in the non-defective object class relative to a number of pixels included in the respective polygon that are classified in the defective object class.

Abstract: Manufacturing processes can be optimized using machine learning models. For example, a system can execute an optimization model to identify a recommended set of values for configurable settings of a manufacturing process associated with an object. The optimization model can determine the recommended set of values by implementing an iterative process using an objective function. Each iteration of the iterative process can include selecting a current set of candidate values for the configurable settings from within a current region of a search space defined by the optimization model; providing the current set of candidate values as input to a trained machine learning model that can predict a value for a target characteristic of the object or the manufacturing process based on the current set of candidate values; and identifying a next region of the search space to use in a next iteration of the iterative process based on the value.