Abstract: The present invention provides a method for performing optical image detection using a camera module comprising a Digital MicroMirror Device, a first point Photo Detector, a second point Photo Detector, a first lens and a second lens.

Abstract: The present invention provides a method for performing optical image detection using a camera module comprising a Digital MicroMirror Device, a first point Photo Detector, a second point Photo Detector, a first lens and a second lens.

Abstract: The present invention provides a method for performing high dynamic range optical image detection of a scene comprising: imaging incident light from a scene onto an object plane; determining the locations of those pixels in the object plane of higher brightness; detecting the optical irradiance values of those pixels of higher brightness to produce a first detected image; detecting the optical irradiance values of those pixels of lower brightness to produce a second detected image; and generating a high dynamic range optical irradiance map of the scene by combining the first detected image and the second detected image into a single image.

Abstract: A method for performing high dynamic range optical image detection of a scene. The method comprises imaging incident light from a scene onto an object plane of an Optical Array Device, the OAD operating in time modulation mode; determining the locations of those pixels in the object plane of a first light level; detecting the optical irradiance values of those pixels of the first light level to produce a first detected image; detecting the optical irradiance values of those pixels of a second light level to produce a second detected image; and generating a high dynamic range optical irradiance map of the scene by combining the first detected image and the second detected image into a single image.

Abstract: The present invention provides a method for performing high dynamic range optical image detection of a scene comprising: imaging incident light from a scene onto an object plane; determining the locations of those pixels in the object plane of higher brightness; detecting the optical irradiance values of those pixels of higher brightness to produce a first detected image; detecting the optical irradiance values of those pixels of lower brightness to produce a second detected image; and generating a high dynamic range optical irradiance map of the scene by combining the first detected image and the second detected image into a single image.

Abstract: A method for performing high dynamic range optical image detection of a scene. The method comprises imaging incident light from a scene onto an object plane of an Optical Array Device, the OAD operating in time modulation mode; determining the locations of those pixels in the object plane of a first light level; detecting the optical irradiance values of those pixels of the first light level to produce a first detected image; detecting the optical irradiance values of those pixels of a second light level to produce a second detected image; and generating a high dynamic range optical irradiance map of the scene by combining the first detected image and the second detected image into a single image.

Abstract: The invention provides power smart in-door optical wireless link that provides lossless beam propagation between Transmitter (T) and Receiver (R) for changing link distances including in conditions of transmit and receive beam spoiling due to environmental effects. Each T/R unit uses a combination of fixed and variable focal length optics (called inverse adaptive optics) to smartly adjust the transmit beam laser beam propagation parameters of minimum beam waist size and its location to produce the optimal zero propagation loss coupling condition at the Receiver for the specific link distance.

Abstract: Silicon Carbide (SiC) probe designs for extreme temperature and pressure sensing uses a single crystal SiC optical chip encased in a sintered SiC material probe. The SiC chip may be protected for high temperature only use or exposed for both temperature and pressure sensing. Hybrid signal processing techniques allow fault-tolerant extreme temperature sensing. Wavelength peak-to-peak (or null-to-null) collective spectrum spread measurement to detect wavelength peak/null shift measurement forms a coarse-fine temperature measurement using broadband spectrum monitoring. The SiC probe frontend acts as a stable emissivity Black-body radiator and monitoring the shift in radiation spectrum enables a pyrometer. This application combines all-SiC pyrometry with thick SiC etalon laser interferometry within a free-spectral range to form a coarse-fine temperature measurement sensor.

Abstract: An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a light directing element for directing light beams at the etalon and receiving reflected light beams from the etalon wherein the received reflected light beams are used for determining an environmental condition proximate the tip portion. A method for measuring a thickness of the etalon may include directing a light beams at different frequencies at the etalon and receiving the light beams from the etalon. The method may also include identifying conditions of the respective light beams condition received from the etalon and then calculating a first thickness of the etalon responsive to the respective conditions and the known characteristic.

Abstract: An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a light directing element for directing light beams at the etalon and receiving reflected light beams from the etalon wherein the received reflected light beams are used for determining an environmental condition proximate the tip portion. A method for measuring a thickness of the etalon may include directing a light beams at different frequencies at the etalon and receiving the light beams from the etalon. The method may also include identifying conditions of the respective light beams condition received from the etalon and then calculating a first thickness of the etalon responsive to the respective conditions and the known characteristic.

Abstract: Silicon Carbide (SiC) probe designs for extreme temperature and pressure sensing uses a single crystal SiC optical chip encased in a sintered SiC material probe. The SiC chip may be protected for high temperature only use or exposed for both temperature and pressure sensing. Hybrid signal processing techniques allow fault-tolerant extreme temperature sensing. Wavelength peak-to-peak (or null-to-null) collective spectrum spread measurement to detect wavelength peak/null shift measurement forms a coarse-fine temperature measurement using broadband spectrum monitoring. The SiC probe frontend acts as a stable emissivity Black-body radiator and monitoring the shift in radiation spectrum enables a pyrometer. This application combines all-SiC pyrometry with thick SiC etalon laser interferometry within a free-spectral range to form a coarse-fine temperature measurement sensor.

Abstract: An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a light directing element for directing light beams at the etalon and receiving reflected light beams from the etalon wherein the received reflected light beams are used for determining an environmental condition proximate the tip portion. A method for measuring a thickness of the etalon may include directing a light beams at different frequencies at the etalon and receiving the light beams from the etalon. The method may also include identifying conditions of the respective light beams condition received from the etalon and then calculating a first thickness of the etalon responsive to the respective conditions and the known characteristic.

Abstract: Two new techniques to form extreme environment minimally invasive freespace targeted optical temperature sensors using preferably single crystal Silicon Carbide (SiC) optical sensor chips. One technique uses wavelength signal processing exploiting the SiC chip's quadratic nature of its Thermo-optic effect. The other sensing method uses spatial signal processing while utilizing the temperature dependent Snell's law effect. A unique multi-sensor temperature measurement system is described using optical switching, fiber-remoting, and wavelength controls.

Abstract: A remote temperature sensing system includes a light source selectively producing light at two different wavelengths and a sensor device having an optical path length that varies as a function of temperature. The sensor receives light emitted by the light source and redirects the light along the optical path length. The system also includes a detector receiving redirected light from the sensor device and generating respective signals indicative of respective intensities of received redirected light corresponding to respective wavelengths of light emitted by the light source. The system also includes a processor processing the signals generated by the detector to calculate a temperature of the device.

Abstract: An agile optical sensor based on spectrally agile heterodyne optical interferometric confocal microscopy implemented via an ultra-stable in-line acousto-optic tunable filter (AOTF) based interferometer using double anisotropic acousto-optic Bragg diffraction. One embodiment uses a tunable laser as the light source while other embodiments use a broadband source or a fixed wavelength laser as the source. One embodiment uses anisotropic diffractions in an AOTF to generate two near-collinear orthogonal linear polarization and slightly displaced beams that both pass via a test sample to deliver highly sensitive sample birefringence or material optical retardation measurements. A spherical lens is used to form focused spots for high resolution spatial sampling of the test object. The laser and AOTF tuning allows birefringence measurements taken at different wavelengths, one at a time.

Abstract: An agile optical beam profiler using a two-dimensional small tilt digital micromirror device/chip, a translation stage, and single photodetector or pair of photodetectors. A method of profiling an optical beam includes positioning a programmable spatial light modulator in an incident optical beam and sequentially moving the spatial light modulator to at least one position in a first planar direction in a displacement increment less than a pixel width of the spatial light modulator. The method also includes directing respective portions of the optical beam to a photodetector at each position of the spatial light modulator. The method may also include calibrating the photodetectors by directing a portion of the beam to the photodetector, then directing the entire beam, or a remaining portion of the beam, to the photodetector, and normalizing the detected power of the portion with the detected power of the entire beam, or remaining portion, respectively.

Abstract: Electronically agile optical filtering modules for equalizing light propagation differences in at least two spaced optical beam pathways in the modules. The modules use optical polarization rotation devices that may include acousto-optic tunable filter (AOTF) devices, liquid crystal devices, and magneto-optic devices. Such devices may be subject to polarization dispersion losses (PDL) and polarization mode dispersion (PMD) that may be different for when light travel along different light paths through the device. By redirecting light beams back along a different bi-directional path through the devices which may exhibit non-uniform performance across orthogonal polarizations, PDL and PMD may be reduced.

Abstract: An optical beam profiler using a spatial light modulator and photodetector. In an embodiment, the spatial light modulator is a two-dimensional (2-D) small tilt digital micromirror device. The profiler features fast speed, digital controls, low polarization sensitivity, and high measurement repeatability. The 2-D multi-pixel device-based profiler allows the use of several beam profile measurement concepts including moving knife edge, scanning slit, moving pinhole, variable aperture, and 2-D photodiode array. The proposed digital optical beam profiler can be implemented with any type of digitally operated 2-D spatial light modulator device such as using liquid crystals, magneto-optics, multiple quantum wells, electro-optic polymers, and photonic crystals.

Abstract: Unique multi-diffraction structures using electronically controlled Bragg diffraction devices such as acousto-optic (AO) devices to accomplish optical beam attenuation control functions. These variable optical attenuator (VOA) modules can be fully inertialess as they can use electronically programmable sub-microsecond speed AO devices to implement optical gain controls. These VOAs deliver desirable capabilities in one optically reversible unit, making high dynamic range, low loss, high power handling, ultra-fast, high optical isolation, broadband operation, self-aligning robust modules. These VOAs can be made essentially independent of the optical polarization of the incident light by the use of a unique fixed waveplate compensation technique within the VOA configuration that suppresses polarization dependent loss. Broadband gain control operation over several wavelengths can be achieved by controlling the frequency and electrical drive power of the chosen frequencies feeding the acousto-optic devices.

Abstract: Fiber-optic beam routing and amplitude control modules based on a unique fault-tolerant scheme using a macro-pixel to control an optical beam are proposed. The unique macro-pixel method involving multiple device pixels per beam inherently provides a robust digital technique for module control while adding to the optical beam alignment tolerance and resistance to catastropic failure for the overall module. The macropixel approach solves the speed versus alignment and failure sensitivity dilemma present in single pixel element based optical micromechanical systems (MEMS). Specifically proposed are fault tolerant fiber-optic attenuators and switches using several microactuated micromirrors per optical beam. Transmissive and reflective module geometries are proposed using small tilt and small distance piston-action micromirrors, leading to fast module reconfiguration speed fiber optic signal controls. The macro-pixel design approach is extended to other pixel technologies such as polarization rotating pixels.