Patents by Inventor Nagamani Nataraj

Nagamani Nataraj has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for probing integrated circuits using polarization difference probing
    Patent number: 7659981
    Abstract: A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a collection electronics. The beam optics is a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the incident laser beam into two beams of orthogonal polarization—one beam simulating a reference beam while the other simulating a probing beam. Both reference and probing beams are pointed to the same location on the DUT. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the reference and probing beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
    Type: Grant
    Filed: October 27, 2005
    Date of Patent: February 9, 2010
    Assignee: DCG Systems, Inc.
    Inventors: William Lo, Kenneth Wilsher, Nagamani Nataraj, Nina Boiadjieva
  • Apparatus and method for probing integrated circuits using laser illumination
    Patent number: 7616312
    Abstract: An apparatus and method for laser probing of a DUT at very high temporal resolution is disclosed. The system includes a CW laser source, a beam optics designed to point two orthogonally polarized beams at the same location on the DUT, optical detectors for detecting the reflected beams, collection electronics, and an oscilloscope. The beam optics defines a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the laser beam into two beams of orthogonal polarization. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: November 10, 2009
    Assignee: DCG Systems, Inc.
    Inventors: Steven Kasapi, Kenneth Wilsher, Gary Woods, William Lo, Radu Ispasoiu, Nagamani Nataraj, Nina Boiadjieva
  • Laser probing system for integrated circuits
    Publication number: 20070046947
    Abstract: A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a collection electronics. The beam optics is a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the incident laser beam into two beams of orthogonal polarization - one beam simulating a reference beam while the other simulating a probing beam. Both reference and probing beams are pointed to the same location on the DUT. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the reference and probing beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
    Type: Application
    Filed: October 27, 2005
    Publication date: March 1, 2007
    Applicant: Credence Systems Corporation
    Inventors: William Lo, Kenneth Wilsher, Nagamani Nataraj, Nina Boiadjieva
  • Laser probing system for integrated circuits
    Publication number: 20070002329
    Abstract: An apparatus and method for laser probing of a DUT at very high temporal resolution is disclosed. The system includes a CW laser source, a beam optics designed to point two orthogonally polarized beams at the same location on the DUT, optical detectors for detecting the reflected beams, collection electronics, and an oscilloscope. The beam optics defines a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the laser beam into two beams of orthogonal polarization. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
    Type: Application
    Filed: June 29, 2005
    Publication date: January 4, 2007
    Inventors: Steven Kasapi, Kenneth Wilsher, Gary Woods, William Lo, Radu Ispasoiu, Nagamani Nataraj, Nina Boiadjieva