Patents by Inventor NAGATANI KENICHI

NAGATANI KENICHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test apparatus and test method
    Patent number: 10935599
    Abstract: A time measurement unit measures the time interval between edges to be monitored in a signal under test DUT_Output including serial data output from a device under test (DUT) 400. A comparison judgment unit calculates the number of bits of the serial data included between the edges to be monitored, based on the time interval thus measured. Furthermore, the comparison judgment unit compares the number of bits thus calculated with an expected value thereof.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: March 2, 2021
    Assignee: ADVANTEST CORPORATION
    Inventor: Nagatani Kenichi
  • TEST APPARATUS AND TEST METHOD
    Publication number: 20190170823
    Abstract: A time measurement unit measures the time interval between edges to be monitored in a signal under test DUT_Output including serial data output from a device under test (DUT) 400. A comparison judgment unit calculates the number of bits of the serial data included between the edges to be monitored, based on the time interval thus measured. Furthermore, the comparison judgment unit compares the number of bits thus calculated with an expected value thereof.
    Type: Application
    Filed: September 28, 2018
    Publication date: June 6, 2019
    Inventor: NAGATANI KENICHI