Patents by Inventor Nandakumar Krishnan

Nandakumar Krishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8093921
    Abstract: In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts in the sub-array. If the voltage levels are greater than a threshold voltage level then the functional integrated circuit device is verified as being reliable.
    Type: Grant
    Filed: February 13, 2009
    Date of Patent: January 10, 2012
    Assignee: Cisco Technology, Inc.
    Inventors: Nandakumar Krishnan, Xinli Gu, Li Li, Jie Xue, Jonathan M. Parlan
  • Publication number: 20100207649
    Abstract: In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts in the sub-array. If the voltage levels are greater than a threshold voltage level then the functional integrated circuit device is verified as being reliable.
    Type: Application
    Filed: February 13, 2009
    Publication date: August 19, 2010
    Inventors: Nandakumar Krishnan, Xinli Gu, Li Li, Jie Xue, Jonathan M. Parlan