Patents by Inventor Nandini Mukherjee

Nandini Mukherjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • OPTICALLY MULTIPLEXED MID-INFRARED LASER SYSTEMS AND USES THEREOF
    Publication number: 20130292571
    Abstract: Optically multiplexed mid-infrared laser systems and the use of such systems for detection and measurement of target materials using multispectral image analysis are disclosed. The systems and methods disclosed herein are useful for detecting and measuring materials in applications such as trace detection, medical diagnostics, medical monitoring, quality control, and high-throughput molecular recognition.
    Type: Application
    Filed: May 25, 2012
    Publication date: November 7, 2013
    Applicant: Infrasign, Inc.
    Inventors: Anadi Mukherjee, Manu Prasanna, Nandini Mukherjee
  • Nonlinear spectrophotometer
    Patent number: 6111641
    Abstract: The purpose of the nonlinear spectrophotometer is to provide a simple instrument that can be used on a routine basis to accurately measure the two-photon absorption (TPA) coefficient and cross-section on a wide variety of materials. The instrument is capable of measuring: (1) both organic and inorganic materials, (2) solutions and thin film materials forms, and (3) materials which are fluorescent and nonfluorescent.
    Type: Grant
    Filed: March 23, 1998
    Date of Patent: August 29, 2000
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Anadi Mukherjee, Nandini Mukherjee, Conrad S. Sarvis, Bruce A. Reinhardt
  • Nonlinear spectrophotometer
    Patent number: 5991021
    Abstract: The purpose of the nonlinear spectrophotometer is to provide a simple instrument that can be used on a routine basis to accurately measure the two-photon absorption (TPA) coefficient and cross-section on a wide variety of materials. The instrument is capable of measuring: (1) both organic and inorganic materials, (2) solutions and thin film materials forms, and (3) materials which are fluorescent and nonfluorescent.
    Type: Grant
    Filed: February 1, 1999
    Date of Patent: November 23, 1999
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Anadi Mukherjee, Nandini Mukherjee, Conrad S. Sarvis, Bruce A. Reinhardt
  • Arrangement for producing large second-order optical nonlinearities in a waveguide structure including amorphous SiO.sub.2
    Patent number: 5247601
    Abstract: A large second order nonlinearity is induced in SiO.sub.2 portions of a waveguide enabling inducement of second order harmonic waves in the waveguide for numerous applications in integrated optics and optoelectronics.
    Type: Grant
    Filed: May 7, 1992
    Date of Patent: September 21, 1993
    Inventors: Richard A. Myers, Nandini Mukherjee, Steven R. J. Brueck