Abstract: The present embodiments relate to electrostatic discharge (ESD) simulation of integrated circuit designs. A netlist of the circuit design can be modified to include ESD protection devices and only essential non-ESD devices. The essential non-ESD devices can be determined based on whether a non-ESD device satisfies one or more of two conditions: (i) a least resistance path (LRP) value of at least one terminal of the non-ESD device from any port of the set of ports is less than a first threshold value or (ii) an effective resistance value between at least one terminal of the non-ESD device from any port of the set of ports is less than a second threshold value. The essential non-ESD devices are included in a reduced netlist in addition to the ESD protection devices. The ESD simulation is carried out on the reduced netlist, thereby reducing simulation time.

Abstract: Disclosed herein are embodiments of systems, methods, and products to automatically and intelligently generate a test bench to test an electrostatic discharge (ESD) protection circuit in an integrated circuit (IC) design. A computer may receive netlist of the IC design forming a device under test (DUT). From the DUT, the computer may extract and/or calculate one or more parameters. Based on the one or more parameters, the computer may generate a test bench comprising a resistance inductance capacitance (RLC) circuit to provide ESD stimulus to the DUT. The ESD stimulus and therefore the test bench may be based on a human body model (HBD) or a charged device model (CDM). In case of the CDM, the computer may allow a circuit designer to select or deselect package parameters for testing the ESD protection circuit.