Patents by Inventor Naohito Inoue

Naohito Inoue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230167229
    Abstract: The present invention provides a blocked isocyanate composition comprising a blocked isocyanate compound in which an isocyanate group of an isocyanate compound is blocked with a fluoroalcohol compound, and at least one amidate compound represented by the following Formula (2): wherein B, G, J, R7. and R8 are as defined in the specification.
    Type: Application
    Filed: April 28, 2021
    Publication date: June 1, 2023
    Applicant: KOEI CHEMICAL COMPANY, LIMITED
    Inventors: Motoyoshi MIYAGI, Mitsuki ONODA, Naohito INOUE
  • Publication number: 20230167310
    Abstract: The present invention provides a curing catalyst which promotes a reaction between a hydroxyalkyl amide-based curing agent and a carboxy group-containing resin, especially curing of a carboxy group-containing resin-based powder coating material using a hydroxyalkyl amide-based curing agent, and in particular, curing of a polyester resin-based powder coating material. A curing catalyst which promotes a reaction between a carboxy group-containing resin and a compound that has a ?-hydroxyalkyl amide group, said curing catalyst containing a compound that contains, as a metal atom, at least one element selected from the group consisting of Mo, Cr, V, Fe, Co, Ni, Ga, Zr, In, Ba, Ce and Bi. It is preferable that the metal atom is an Mo atom. An Al atom may be included as the metal atom.
    Type: Application
    Filed: April 27, 2021
    Publication date: June 1, 2023
    Inventors: Naohito INOUE, Tsuyoshi TAGATA, Motoyoshi MIYAGI
  • Patent number: 7361909
    Abstract: A method and apparatus for correcting drift of the beam irradiation position during automated FIB (focused ion beam) processing with a reference image-setting unit, an image read-in unit for reading in images of the reference image region during the FIB processing, an arithmetic-and-control unit for finding the direction and amount of image deviation between the subsequent images, and a beam deflection system-adjusting unit for correcting the beam deflection system by correcting the image deviation based on the deviation in response to the output from the arithmetic-and-control unit. The arithmetic-and-control unit optimizes the brightness or contrast of the reference image.
    Type: Grant
    Filed: November 23, 2005
    Date of Patent: April 22, 2008
    Assignee: Jeol Ltd.
    Inventors: Ryoichi Ichikawa, Akihiko Haraguchi, Yuji Hasegawa, Naohito Inoue, Kazutomo Shimizu
  • Publication number: 20060138356
    Abstract: A method and apparatus for correcting drift of the beam irradiation position during automated FIB (focused ion beam) processing with a reference image-setting unit, an image read-in unit for reading in images of the reference image region during the FIB processing, an arithmetic-and-control unit for finding the direction and amount of image deviation between the subsequent images, and a beam deflection system-adjusting unit for correcting the beam deflection system by correcting the image deviation based on the deviation in response to the output from the arithmetic-and-control unit. The arithmetic-and-control unit optimizes the brightness or contrast of the reference image.
    Type: Application
    Filed: November 23, 2005
    Publication date: June 29, 2006
    Applicant: JEOL Ltd.
    Inventors: Ryoichi Ichikawa, Akihiko Haraguchi, Yuji Hasegawa, Naohito Inoue, Kazutomo Shimizu