Abstract: A position detection system includes a magnetic pole block and a magnetic sensor. The magnetic pole block includes a plurality of magnetic poles arranged in a first direction. The plurality of magnetic poles are arranged such that N poles and S poles are alternately arranged as the plurality of magnetic poles in the first direction. At least one member selected from the magnetic pole block and the magnetic sensor is movable in the first direction with respect to the other member. The magnetic sensor includes a plurality of magnetoresistive effect elements and a bias magnet. The plurality of magnetoresistive effect elements are arranged side by side in the first direction. The bias magnet applies, to the plurality of magnetoresistive effect elements, a magnetic field having an orientation toward one of two opposite sides of the first direction.

Abstract: A scanning microscope includes a scanning unit that causes irradiation light emitted by a light source to scan a sample, an optical system that guides the emitted light that has passed through the scanning unit to the sample, an isolation unit that includes a transmissive portion that enables the irradiation light to pass the transmissive portion and a reflective portion that reflects at least some of light that is included in emitted light generated from the sample as a result of the irradiation light being radiated to the sample and that has passed through the optical system and the scanning unit, and a detection unit that detects the emitted light that has passed through the isolation unit. The isolation unit is disposed in an optical path of the irradiation light between the light source and the scanning unit.

Abstract: Image acquisition apparatuses, spectral apparatuses, methods and storage mediums for use with same are provided herein. At least one apparatus includes: a diffraction element irradiated by a light; a fiber for receiving reflected scattered light from a subject; a diffraction grating dispersing the transmitted light into light fluxes of wavelength bands again; an optical system imaging the split light fluxes; and an imaging device near the focal point of the optical system. An image is changed by rotating the diffraction grating, from which a two-dimensional image is acquired. The transmitted light may be branched into two or more, and input to a collimator lens and imaged as multiple spectral sequences by the optical system. At least one apparatus may form light fluxes traveling at different angles; and may acquire spectral information of the reflected and scattered light. Preferably, for the luminous fluxes, no gap exists in an image.

Abstract: A Spectrally Encoded Forward View or Multi-View Endoscope, Probe, and Imaging Apparatus and system, and methods and storage mediums for use therewith, are provided herein. At least one apparatus or system may comprise a first waveguide; an optical system; and a diffraction grating. The first waveguide may be for guiding light from a light source to an output port of the first waveguide. The optical system may comprise at least a first reflecting surface and a second reflecting surface. The first reflecting surface may be arranged to reflect light from the output port of the first waveguide to the second reflecting surface. The second reflecting surface may be arranged to reflect light from the first reflecting surface back through the first reflecting surface to the diffraction grating. The diffraction grating may diffract light from the second reflecting surface in several lights/colors of non-zero diffraction orders in a first direction.

Abstract: A Spectrally Encoded Forward View or Multi-View Endoscope, Probe, and Imaging Apparatus and system, and methods and storage mediums for use therewith, are provided herein. At least one apparatus or system may comprise a first waveguide; an optical system; and a diffraction grating. The first waveguide may be for guiding light from a light source to an output port of the first waveguide. The optical system may comprise at least a first reflecting surface and a second reflecting surface. The first reflecting surface may be arranged to reflect light from the output port of the first waveguide to the second reflecting surface. The second reflecting surface may be arranged to reflect light from the first reflecting surface back through the first reflecting surface to the diffraction grating. The diffraction grating may diffract light from the second reflecting surface in several lights/colors of non-zero diffraction orders in a first direction.

Abstract: Image acquisition apparatuses, spectral apparatuses, methods and storage mediums for use with same are provided herein. At least one apparatus includes: a diffraction element irradiated by a light; a fiber for receiving reflected scattered light from a subject; a diffraction grating dispersing the transmitted light into light fluxes of wavelength bands again; an optical system imaging the split light fluxes; and an imaging device near the focal point of the optical system. An image is changed by rotating the diffraction grating, from which a two-dimensional image is acquired. The transmitted light may be branched into two or more, and input to a collimator lens and imaged as multiple spectral sequences by the optical system. At least one apparatus may form light fluxes traveling at different angles; and may acquire spectral information of the reflected and scattered light. Preferably, for the luminous fluxes, no gap exists in an image.

Abstract: A noise reduction apparatus includes a first delaying/combining unit configured to output first and second pulse light beams, and a second delaying/combining unit configured to branch the first pulse light beam into two pulse light beams to output third and fourth pulse light beams and branch the second pulse light beam into two pulse light beams to output fifth and sixth pulse light beams.

Abstract: A noise reduction apparatus includes a first delaying/combining unit configured to output first and second pulse light beams, and a second delaying/combining unit configured to branch the first pulse light beam into two pulse light beams to output third and fourth pulse light beams and branch the second pulse light beam into two pulse light beams to output fifth and sixth pulse light beams.

Abstract: A noise reduction apparatus includes a first delaying/combining unit configured to output first and second pulse light beams, and a second delaying/combining unit configured to branch the first pulse light beam into two pulse light beams to output third and fourth pulse light beams and branch the second pulse light beam into two pulse light beams to output fifth and sixth pulse light beams.

Abstract: A noise reduction apparatus includes a first delaying/combining unit configured to output first and second pulse light beams, and a second delaying/combining unit configured to branch the first pulse light beam into two pulse light beams to output third and fourth pulse light beams and branch the second pulse light beam into two pulse light beams to output fifth and sixth pulse light beams.

Abstract: A pulsed light synchronizer synchronizes a first pulsed light having a first period and a second pulsed light and having a second period equal to the first period with each other. A third pulsed light is acquired by providing a first delay time between two pulsed lights acquired by dividing the first pulsed light, and by multiplexing the pulsed lights acquired from the first pulsed light. A fourth pulsed light is acquired by providing a second delay time between two pulsed lights acquired by dividing the second pulsed light, and by multiplexing the pulsed lights acquired from the second pulsed light. The pulsed light synchronizer detects, through a detector, a pulsed light acquired by multiplexing the third and fourth pulsed lights, and adjusts at least one of the first and second periods based on a timing difference between the third and fourth pulsed lights acquired from the detector.

Abstract: A pulsed light synchronizer synchronizes a first pulsed light having a first period and a second pulsed light and having a second period equal to the first period with each other. A third pulsed light is acquired by providing a first delay time between two pulsed lights acquired by dividing the first pulsed light, and by multiplexing the pulsed lights acquired from the first pulsed light. A fourth pulsed light is acquired by providing a second delay time between two pulsed lights acquired by dividing the second pulsed light, and by multiplexing the pulsed lights acquired from the second pulsed light. The pulsed light synchronizer detects, through a detector, a pulsed light acquired by multiplexing the third and fourth pulsed lights, and adjusts at least one of the first and second periods based on a timing difference between the third and fourth pulsed lights acquired from the detector.

Abstract: A scanning microscope includes a scanning unit that causes irradiation light emitted by a light source to scan a sample, an optical system that guides the emitted light that has passed through the scanning unit to the sample, an isolation unit that includes a transmissive portion that enables the irradiation light to pass the transmissive portion and a reflective portion that reflects at least some of light that is included in emitted light generated from the sample as a result of the irradiation light being radiated to the sample and that has passed through the optical system and the scanning unit, and a detection unit that detects the emitted light that has passed through the isolation unit. The isolation unit is disposed in an optical path of the irradiation light between the light source and the scanning unit.

Abstract: There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.

Abstract: There is provided an X-ray imaging method for reducing unnecessary components caused by a transmittance distribution of an object and unevenness in irradiation by a light source and accurately calculating a differential phase at the time of X-ray imaging by SDG.

Abstract: A Talbot interferometer includes a diffraction grating, an image pickup device, a moving unit configured to move at least one of the diffraction grating and the image pickup device in an optical axis direction of the test object, and a computer configured to adjust a position of the at least one of the diffraction grating and the image pickup device using the moving unit so that a Talbot condition can be met, based on a spatial frequency spectrum obtained from a plurality of interference fringes captured by the image pickup device while moving the at least one of the diffraction grating and the image pickup device using the moving unit.

Abstract: There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.

Abstract: There is provided an X-ray imaging method for reducing unnecessary components caused by a transmittance distribution of an object and unevenness in irradiation by a light source and accurately calculating a differential phase at the time of X-ray imaging by SDG.

Abstract: A Talbot interferometer includes a diffraction grating, an image pickup device, a moving unit configured to move at least one of the diffraction grating and the image pickup device in an optical axis direction of the test object, and a computer configured to adjust a position of the at least one of the diffraction grating and the image pickup device using the moving unit so that a Talbot condition can be met, based on a spatial frequency spectrum obtained from a plurality of interference fringes captured by the image pickup device while moving the at least one of the diffraction grating and the image pickup device using the moving unit.

Abstract: The semiconductor laser unit comprises a laser emission part having a plurality of semiconductor laser elements of different laser beam wavelengths, and a mirror part having an optical reflection film for reflecting laser beams emitted from the laser emission part. The mirror part is blocked out into a plurality of areas to which each laser beam emitted from each of the plurality of semiconductor laser elements enters, and at the same time the reflection film having high reflectance for the laser beams that enter selectively on the areas is provided in each of the plurality of areas.