Patents by Inventor Naoki Sagisaka

Naoki Sagisaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11169023
    Abstract: An optical measuring device includes a light measurement unit, an acceleration sensor for detecting the acceleration of the optical measuring device, a storage for storing reference data obtained from the light measurement unit by measuring light from a reference object at a first timing and storing the acceleration detected by the acceleration sensor as history information, a first determination unit for determining whether the result of comparison between measurement data obtained from the light measurement unit by measuring light from the reference object at a second timing later than the first timing and the reference data satisfies a first malfunction condition, a second determination unit for determining whether the acceleration included in the history information satisfies a second malfunction condition, and an output unit for outputting that the optical measuring device malfunctions when the first malfunction condition and the second malfunction condition are satisfied.
    Type: Grant
    Filed: April 10, 2017
    Date of Patent: November 9, 2021
    Assignee: Konica Minolta, Inc.
    Inventors: Koji Yamamoto, Masahiko Sakimoto, Naoki Sagisaka, Akihiro Okayama, Satoshi Yokota, Norimasa Kubota
  • Publication number: 20200326237
    Abstract: An optical measuring device includes a light measurement unit, an acceleration sensor for detecting the acceleration of the optical measuring device, a storage for storing reference data obtained from the light measurement unit by measuring light from a reference object at a first timing and storing the acceleration detected by the acceleration sensor as history information, a first determination unit for determining whether the result of comparison between measurement data obtained from the light measurement unit by measuring light from the reference object at a second timing later than the first timing and the reference data satisfies a first malfunction condition, a second determination unit for determining whether the acceleration included in the history information satisfies a second malfunction condition, and an output unit for outputting that the optical measuring device malfunctions when the first malfunction condition and the second malfunction condition are satisfied.
    Type: Application
    Filed: April 10, 2017
    Publication date: October 15, 2020
    Inventors: Koji YAMAMOTO, Masahiko SAKIMOTO, Naoki SAGISAKA, Akihiro OKAYAMA, Satoshi YOKOTA, Norimasa KUBOTA
  • Patent number: 7549586
    Abstract: An optical measurement system which manages whether an optical property of a sample falls within a predetermined management range. The optical measurement system has a measuring device for measuring the optical property value of the inspected sample, a reader for reading an attribute identification information of an identification tag attached to the sample, and a storage section for storing optical property management information concerning a plurality of kinds of samples each in a manner corresponding to attribute identification information of each sample. A controller in the optical measurement system reads out from the storage section the optical property management information corresponding to the attribute identification information of the sample read by said reader, and compares the optical property management information with the optical property value of the sample, and then determines whether the optical property value falls within an allowable range in the optical property management information.
    Type: Grant
    Filed: June 24, 2005
    Date of Patent: June 23, 2009
    Assignee: Konica Minolta Sensing, Inc.
    Inventors: Koji Watanabe, Toru Kobayashi, Masao Nakamuro, Naoki Sagisaka
  • Publication number: 20060000885
    Abstract: An optical measurement system which manages whether an optical property of a sample falls within a predetermined management range. The optical measurement system has a measuring device for measuring the optical property value of the inspected sample, a reader for reading an attribute identification information of an identification tag attached to the sample, and a storage section for storing optical property management information concerning a plurality of kinds of samples each in a manner corresponding to attribute identification information of each sample. A controller in the optical measurement system reads out from the storage section the optical property management information corresponding to the attribute identification information of the sample read by said reader, and compares the optical property management information with the optical property value of the sample, and then determines whether the optical property value falls within an allowable range in the optical property management information.
    Type: Application
    Filed: June 24, 2005
    Publication date: January 5, 2006
    Inventors: Koji Watanabe, Toru Kobayashi, Masao Nakamuro, Naoki Sagisaka
  • Patent number: 6088117
    Abstract: A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the stor
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: July 11, 2000
    Assignee: Minolta Co., Ltd.
    Inventors: Kenji Imura, Masayuki Makino, Wataru Yamaguchi, Hiroshi Kohsaka, Naoki Sagisaka