Patents by Inventor Naoki Shinsei

Naoki Shinsei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Arc resistance performance evaluation device, arc resistance performance evaluation system, and arc resistance performance evaluation method
    Patent number: 9140732
    Abstract: The present device includes a high frequency induction thermal plasma generation unit 10; a second tube portion 20, which is connected to a first tube portion 13 and which includes window 25 on at least one side surface; and a testing subject installing pedestal 23 configured to be fixedly attached at a reference position in the second tube portion 20, wherein the testing subject installing pedestal 23 includes a seating portion for installing the testing subject 40, and a hold-down portion for fixing the installed testing subject 40 with a part of the testing subject exposed; and an ablated vapor generated from the testing subject is observed through the window from an outer side of the second tube portion.
    Type: Grant
    Filed: April 26, 2013
    Date of Patent: September 22, 2015
    Assignee: KANEKA CORPORATION
    Inventors: Yasunori Tanaka, Masahiro Ishida, Naoki Shinsei, Hiroyasu Hagi, Atsushi Mizobuchi
  • ARC RESISTANCE PERFORMANCE EVALUATION DEVICE, ARC RESISTANCE PERFORMANCE EVALUATION SYSTEM, AND ARC RESISTANCE PERFORMANCE EVALUATION METHOD
    Publication number: 20130241582
    Abstract: The present device includes a high frequency induction thermal plasma generation unit 10; a second tube portion 20, which is connected to a first tube portion 13 and which includes window 25 on at least one side surface; and a testing subject installing pedestal 23 configured to be fixedly attached at a reference position in the second tube portion 20, wherein the testing subject installing pedestal 23 includes a seating portion for installing the testing subject 40, and a hold-down portion for fixing the installed testing subject 40 with a part of the testing subject exposed; and an ablated vapor generated from the testing subject is observed through the window from an outer side of the second tube portion.
    Type: Application
    Filed: April 26, 2013
    Publication date: September 19, 2013
    Applicant: KANEKA CORPORATION
    Inventors: Yasunori Tanaka, Masahiro Ishida, Naoki Shinsei, Hiroyasu Hagi, Atsushi Mizobuchi
  • ARC RESISTANCE PERFORMANCE EVALUATION DEVICE, ARC RESISTANCE PERFORMANCE EVALUATION SYSTEM, AND ARC RESISTANCE PERFORMANCE EVALUATION METHOD
    Publication number: 20130241569
    Abstract: The present device includes a high frequency induction thermal plasma generation unit 10; a second tube portion 20, which is connected to a first tube portion 13 and which includes window 25 on at least one side surface; and a testing subject installing pedestal 23 configured to be fixedly attached at a reference position in the second tube portion 20, wherein the testing subject installing pedestal 23 includes a seating portion for installing the testing subject 40, and a hold-down portion for fixing the installed testing subject 40 with a part of the testing subject exposed; and an ablated vapor generated from the testing subject is observed through the window from an outer side of the second tube portion.
    Type: Application
    Filed: March 15, 2013
    Publication date: September 19, 2013
    Applicant: KANEKA CORPORATION
    Inventors: Yasunori Tanaka, Masahiro Ishida, Naoki Shinsei, Hiroyasu Hagi, Atsushi Mizobuchi