Patents by Inventor Naomi Kotwal

Naomi Kotwal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210407127
    Abstract: A method images a region of interest of a sample using a tomographic X-ray microscope. The method includes registering a position of the sample. Registering includes: imaging a portion of the sample containing a feature using the microscope, identifying the feature by matching the feature to a pre-recorded feature, and determining a relative position of the feature in relation to the pre-recorded feature. The method also includes navigating a field of view of the microscope over the region of interest based on the registered position of the sample, and imaging the region of interest using the microscope.
    Type: Application
    Filed: September 9, 2021
    Publication date: December 30, 2021
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Lorenz Lechner, Wayne Broderick
  • Publication number: 20210404977
    Abstract: A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.
    Type: Application
    Filed: September 9, 2021
    Publication date: December 30, 2021
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Zheren Wu, Wayne Broderick
  • Patent number: 10169865
    Abstract: An x-ray imaging system data acquisition and image reconstruction system and method are disclosed which enable optimizing the image parameters based on multiple tomographic volumes of the sample that have been captured using an x-ray microscopy system. This enables the operator to control the image contrast, for example, of selected slices, and apply the information associated with optimizing the contrast of the selected slice to all slices in two or more tomographic volume data sets. This creates a combined volume with optimized image contrast throughout. Also, the system enables navigation within the volumes through functional annotation, improvements in volume registration and improvements in noise suppression both within the volumes and within slice histograms of the sample.
    Type: Grant
    Filed: October 17, 2016
    Date of Patent: January 1, 2019
    Assignee: Carl Zeiss X-Ray Microscopy, Inc.
    Inventors: Thomas A. Case, Susan Candell, Srivatsan Seshadri, Naomi Kotwal
  • Publication number: 20170109882
    Abstract: An x-ray imaging system data acquisition and image reconstruction system and method are disclosed which enable optimizing the image parameters based on multiple tomographic volumes of the sample that have been captured using an x-ray microscopy system. This enables the operator to control the image contrast, for example, of selected slices, and apply the information associated with optimizing the contrast of the selected slice to all slices in two or more tomographic volume data sets. This creates a combined volume with optimized image contrast throughout. Also, the system enables navigation within the volumes through functional annotation, improvements in volume registration and improvements in noise suppression both within the volumes and within slice histograms of the sample.
    Type: Application
    Filed: October 17, 2016
    Publication date: April 20, 2017
    Inventors: Thomas A. Case, Susan Candell, Srivatsan Seshadri, Naomi Kotwal