Patents by Inventor Naoshi Yamahira

Naoshi Yamahira has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11403747
    Abstract: A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: August 2, 2022
    Assignee: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Patent number: 11391662
    Abstract: Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: July 19, 2022
    Assignee: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Publication number: 20220205893
    Abstract: An object is to measure the fine ratio, or the ratio of fines adhering to the surface of lumps of material, in real time with high accuracy. A fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in the step S2 to a fine ratio. The feature quantity calculated in the step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.
    Type: Application
    Filed: April 3, 2020
    Publication date: June 30, 2022
    Applicant: JFE STEEL CORPORATION
    Inventors: Toshiki TSUBOI, Naoshi YAMAHIRA
  • Patent number: 11187637
    Abstract: A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material.
    Type: Grant
    Filed: March 19, 2019
    Date of Patent: November 30, 2021
    Assignee: JFE STEEL CORPORATION
    Inventors: Naoshi Yamahira, Toshiki Tsuboi
  • Publication number: 20210102885
    Abstract: Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.
    Type: Application
    Filed: March 30, 2018
    Publication date: April 8, 2021
    Applicant: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Publication number: 20210048386
    Abstract: A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.
    Type: Application
    Filed: March 26, 2019
    Publication date: February 18, 2021
    Inventors: Naoshi Yamahira, Toshiki Tsuboi
  • Publication number: 20210018418
    Abstract: A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material.
    Type: Application
    Filed: March 19, 2019
    Publication date: January 21, 2021
    Applicant: JFE STEEL CORPORATION
    Inventors: Naoshi YAMAHIRA, Toshiki TSUBOI
  • Publication number: 20190370953
    Abstract: A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.
    Type: Application
    Filed: November 29, 2017
    Publication date: December 5, 2019
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Patent number: 10151006
    Abstract: A method of detecting an abnormality in a blast furnace, wherein the abnormality causes clogging of a tuyere unit of the blast furnace, the method including capturing an image of a raceway unit through an in-furnace monitor window disposed at the tuyere unit; and determining that the abnormality has occurred when a brightness of the captured image is lower than or equal to a predetermined brightness threshold and a rate of decrease in the brightness is lower than or equal to a predetermined brightness-decrease-rate threshold.
    Type: Grant
    Filed: June 13, 2014
    Date of Patent: December 11, 2018
    Assignee: JFE STEEL CORPORATION
    Inventors: Naoshi Yamahira, Toshifumi Kodama, Yasuyuki Morikawa, Yusuke Tanaka
  • Patent number: 9799110
    Abstract: An abnormality detection method of detecting abnormality of a blast furnace from tuyere images shot by cameras installed in vicinities of a plurality of tuyeres of the blast furnace includes: collecting, in a time-series manner, representative brightness vectors defined by representative brightnesses determined based on brightness values of respective pixels for each of the tuyeres image previously shot by the cameras at a same time; extracting a principal component vector by performing principal component analysis on the representative brightness vectors collected in the time-series manner; calculating, as an evaluation value, a length of a normal line drawn in a direction of the principal component vector from the representative brightness vector collected from the tuyere images shot by the cameras at the same time during an operation; and detecting the abnormality of the blast furnace by comparing the evaluation value with a predetermined threshold.
    Type: Grant
    Filed: June 18, 2014
    Date of Patent: October 24, 2017
    Assignee: JFE STEEL CORPORATION
    Inventors: Kazuro Tsuda, Takehide Hirata, Naoshi Yamahira, Hidekazu Abe
  • Patent number: 9638516
    Abstract: An oven wall shape measuring apparatus includes: a slit laser light source that is arranged in a thermally-insulated protection box having a slit-like window and emits slit-like laser light; a laser light mirror that reflects the laser light and irradiates an oven wall surface with the laser light via the window; an imaging mirror that reflects reflected light due to irradiation of the laser light and self-emitting light emitted from the oven wall surface, the reflected light and the self-emitting light entering the thermally-insulated protection box via the window; and an imaging device that images, via an optical filter, the self-emitting light and the reflected light that are reflected from the imaging mirror.
    Type: Grant
    Filed: December 19, 2011
    Date of Patent: May 2, 2017
    Assignee: JFE STEEL CORPORATION
    Inventors: Naoshi Yamahira, Toshifumi Kodama
  • Publication number: 20160153062
    Abstract: A method of detecting an abnormality in a blast furnace, wherein the abnormality causes clogging of a tuyere unit of the blast furnace, the method including capturing an image of a raceway unit through an in-furnace monitor window disposed at the tuyere unit; and determining that the abnormality has occurred when a brightness of the captured image is lower than or equal to a predetermined brightness threshold and a rate of decrease in the brightness is lower than or equal to a predetermined brightness-decrease-rate threshold.
    Type: Application
    Filed: June 13, 2014
    Publication date: June 2, 2016
    Applicant: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Toshifumi Kodama, Yasuyuki Morikawa, Yusuke Tanaka
  • Publication number: 20160148365
    Abstract: An abnormality detection method of detecting abnormality of a blast furnace from tuyere images shot by cameras installed in vicinities of a plurality of tuyeres of the blast furnace includes: collecting, in a time-series manner, representative brightness vectors defined by representative brightnesses determined based on brightness values of respective pixels for each of the tuyeres image previously shot by the cameras at a same time; extracting a principal component vector by performing principal component analysis on the representative brightness vectors collected in the time-series manner; calculating, as an evaluation value, a length of a normal line drawn in a direction of the principal component vector from the representative brightness vector collected from the tuyere images shot by the cameras at the same time during an operation; and detecting the abnormality of the blast furnace by comparing the evaluation value with a predetermined threshold.
    Type: Application
    Filed: June 18, 2014
    Publication date: May 26, 2016
    Applicant: JFE STEEL CORPORATION
    Inventors: Kazuro TSUDA, Takehide HIRATA, Naoshi YAMAHIRA, Hidekazu ABE
  • Publication number: 20130286406
    Abstract: An oven wall shape measuring apparatus includes: a slit laser light source that is arranged in a thermally-insulated protection box having a slit-like window and emits slit-like laser light; a laser light mirror that reflects the laser light and irradiates an oven wall surface with the laser light via the window; an imaging mirror that reflects reflected light due to irradiation of the laser light and self-emitting light emitted from the oven wall surface, the reflected light and the self-emitting light entering the thermally-insulated protection box via the window; and an imaging device that images, via an optical filter, the self-emitting light and the reflected light that are reflected from the imaging mirror.
    Type: Application
    Filed: December 19, 2011
    Publication date: October 31, 2013
    Applicant: JFE STEEL CORPORATION
    Inventors: Naoshi Yamahira, Toshifumi Kodama