Patents by Inventor Naotaka Toyama

Naotaka Toyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8287331
    Abstract: There is disclosed a method for manufacturing a polishing pad that is formed of a urethane foam pad and attached to a turn table to polish a wafer, the method comprising at least steps of: slicing a urethane foam cake to provide the urethane foam pad; and performing press processing with respect to the urethane foam pad with a pressure of 15000 g/cm2 or above, a polishing pad manufactured by this method, and a method for polishing a wafer by using this polishing pad. There can be provided a method for manufacturing a polishing pad that can stably obtain a wafer with high flatness, etc.
    Type: Grant
    Filed: April 1, 2008
    Date of Patent: October 16, 2012
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Koichi Kanaya, Masayoshi Sekizawa, Naotaka Toyama
  • Publication number: 20080248728
    Abstract: There is disclosed a method for manufacturing a polishing pad that is formed of a urethane foam pad and attached to a turn table to polish a wafer, the method comprising at least steps of: slicing a urethane foam cake to provide the urethane foam pad; and performing press processing with respect to the urethane foam pad with a pressure of 15000 g/cm2 or above, a polishing pad manufactured by this method, and a method for polishing a wafer by using this polishing pad. There can be provided a method for manufacturing a polishing pad that can stably obtain a wafer with high flatness, etc.
    Type: Application
    Filed: April 1, 2008
    Publication date: October 9, 2008
    Applicant: SHIN-ETSU HANDOTAI CO., LTD.
    Inventors: Koichi Kanaya, Masayoshi Sekizawa, Naotaka Toyama
  • Patent number: 6558233
    Abstract: Provided are a wafer polishing method in which, in single side polishing, covering a wafer holding surface (one side surface) with a protective film, a wafer polishing surface (the other side surface) is polished, so that the wafer holding surface can be prevented from being etched and contaminated by a polishing agent; a wafer cleaning method in which the protective film that remains behind on the wafer holding surface after polishing can be efficiently removed, and a waste cleaning solution is easily treated; and a wafer protective film that sufficiently covers the wafer holding surface in polishing but is effectively removed in cleaning.
    Type: Grant
    Filed: December 28, 2000
    Date of Patent: May 6, 2003
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Takashi Matsuoka, Naotaka Toyama, Hideki Munakata, Hisashi Masumura
  • Patent number: 6422922
    Abstract: A workpiece holder for polishing comprising a workpiece holder body which is provided with multiple perforated holes for holding a workpiece by vacuum suction and a holder back plate which is closely contacted with a back face of the holder body and has grooves for vacuum, wherein the holder back plate is composed of a synthetic resin and has an Asker C hardness of 70 or higher but lower than 98, and an apparatus for polishing a workpiece and a method for polishing a workpiece utilizing it. By improving the material of holder back plate of a workpiece holder for polishing that holds a workpiece by vacuum suction to enhance sealing with the holder body, thereby developing such a holder back plate that should not transfer deformation of the holder body to the workpiece surface, even if polishing agent slurry is introduced and solidified, to provide a workpiece holder for polishing having a workpiece holding surface of high precision, an apparatus for polishing a workpiece and a method for polishing a workpiece.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: July 23, 2002
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Kouichi Okamura, Fumio Suzuki, Hisashi Masumura, Kouzi Morita, Naotaka Toyama
  • Patent number: 6386957
    Abstract: By improving the material of workpiece holder body of a workpiece holder for polishing that holds a workpiece by vacuum adsorption, and the material of resin film for coating a workpiece holding surface of the holder, and developing a method for coating the surface with a resin, which does not cause blocking of perforated holes of the holder body with the resin during the resin coating process, there are provided a workpiece holder for polishing having a workpiece holding surface of high precision, and a method for producing it. According to the present invention, there are provided a workpiece holder for polishing having a workpiece holder body provided with multiple perforated holes for holding a workpiece by vacuum adsorption, wherein a holding surface of the holder body is coated with a coating film formed by applying a thermosetting resin on the holding surface and curing it with heating, and a surface of the coating film is polished, and a method for producing it.
    Type: Grant
    Filed: June 16, 2000
    Date of Patent: May 14, 2002
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Hisashi Masumura, Kouichi Tanaka, Fumio Suzuki, Kouzi Morita, Kouichi Okamura, Naotaka Toyama