Abstract: The disclosed device performs a control of generating a test pattern for the delay test of LSI. The input pattern control circuit counts a cycle number of an input pattern supplied to a test object circuit, and stops supply of the input pattern to the test object circuit when the cycle number of the input pattern coincides with a certain count number. The scan control circuit receives a control signal from the input pattern control circuit, and supplies a scan shift signal to the test object circuit to shift a scan chain in the test object circuit.

Abstract: A simulation apparatus that performs simulation of design data of a verification target circuit including a logic circuit that operates as a multi-cycle path of N cycles in synchronization with a clock signal, the simulation apparatus includes a design data generation section that generates design data of a multi-cycle verification circuit for selectively providing an undefined value signal in place of a signal in a multi-cycle part in the verification target circuit; a logical simulation section that performs logical simulation, without delay, on the basis of design data of the verification target circuit and the design data of the multi-cycle verification circuit; and a comparison section that compares the signal of the verification target circuit with a signal of an expected value in the verification target circuit in the logical simulation.

Abstract: The disclosed device performs a control of generating a test pattern for the delay test of LSI. The input pattern control circuit counts a cycle number of an input pattern supplied to a test object circuit, and stops supply of the input pattern to the test object circuit when the cycle number of the input pattern coincides with a certain count number. The scan control circuit receives a control signal from the input pattern control circuit, and supplies a scan shift signal to the test object circuit to shift a scan chain in the test object circuit.

Abstract: A program that simulates a netlist data including a plurality of basic elements using a computer includes a logic operation section configured to stipulate a logic operation of at least one of the plurality of the basic elements, a change detection section configured to detect changes in signal levels at an input-and-output end of the at least one of the plurality of the basic elements, and a data storage section configured to store a position data corresponding to the changes of the signal levels.

Abstract: A simulation apparatus that performs simulation of design data of a verification target circuit including a logic circuit that operates as a multi-cycle path of N cycles in synchronization with a clock signal, the simulation apparatus includes a design data generation section that generates design data of a multi-cycle verification circuit for selectively providing an undefined value signal in place of a signal in a multi-cycle part in the verification target circuit; a logical simulation section that performs logical simulation, without delay, on the basis of design data of the verification target circuit and the design data of the multi-cycle verification circuit; and a comparison section that compares the signal of the verification target circuit with a signal of an expected value in the verification target circuit in the logical simulation.

Abstract: In lower hierarchy design in which a plurality of circuit blocks are independently designed, a reset adjustment circuit propagating deactivation transition of a reset signal to flip-flops in synchronization with a clock signal is inserted immediately after a reset input pin in each circuit block, and timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal from the reset adjustment circuit to the flip-flops. In upper hierarchy design in which an entire semiconductor integrated circuit is designed, timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal, according to setup times and hold times of the reset signal that are prescribed respectively for the reset input pins of the circuit blocks.

Abstract: In lower hierarchy design in which a plurality of circuit blocks are independently designed, a reset adjustment circuit propagating deactivation transition of a reset signal to flip-flops in synchronization with a clock signal is inserted immediately after a reset input pin in each circuit block, and timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal from the reset adjustment circuit to the flip-flops. In upper hierarchy design in which an entire semiconductor integrated circuit is designed, timing adjustment using the clock signal as a reference is implemented for signal paths of the reset signal, according to setup times and hold times of the reset signal that are prescribed respectively for the reset input pins of the circuit blocks.