Abstract: In one embodiment, a charged-particle trajectory measurement apparatus for measuring a trajectory of a cosmic ray muon as a charged particle includes: a plurality of detectors, each of which generates a detection signal at the time of detecting a cosmic ray muon; a signal processing circuit that processes the detection signal from the detector; a time calculator that calculates the generation time point of the detection signal from the detector on the basis of the signal outputted from the signal processing circuit; a trajectory calculator that calculates the trajectory of the cosmic ray muon on the basis of the generation time point of the detection signal and the positional information of the detector having detected the cosmic ray muon, wherein the signal processing circuit and each of the detectors are integrally configured by being coupled to each other.

Abstract: In one embodiment, a charged-particle trajectory measurement apparatus for measuring a trajectory of a cosmic ray muon as a charged particle includes: a plurality of detectors, each of which generates a detection signal at the time of detecting a cosmic ray muon; a signal processing circuit that processes the detection signal from the detector; a time calculator that calculates the generation time point of the detection signal from the detector on the basis of the signal outputted from the signal processing circuit; a trajectory calculator that calculates the trajectory of the cosmic ray muon on the basis of the generation time point of the detection signal and the positional information of the detector having detected the cosmic ray muon, wherein the signal processing circuit and each of the detectors are integrally configured by being coupled to each other.

Abstract: According to one embodiment, a charged-particle measurement apparatus comprising: a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed; a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the gas detectors and each of the parameters associated with the gas detectors; a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target; a signal intensity acquirer configured to acquire signal intensity of the detection signals; an operating state monitor configured to evaluate the operating states of the gas detectors based on the signal intensity corresponding to the gas detectors; and a parameter updating processor configured to update at least one parameter when at least one of the operating states of the gas detectors associated with this parameter changes.

Abstract: According to one embodiment, a radiation detector includes a stacked body. The stacked body includes a first scintillator layer, a first conductive layer, a second conductive layer and an organic semiconductor layer. The second conductive layer is provided between the first scintillator layer and the first conductive layer. The organic semiconductor layer is provided between the first conductive layer and the second conductive layer. The organic semiconductor layer includes a first element. The first element includes at least one selected from the group consisting of boron, gadolinium, helium, lithium, and cadmium.

Abstract: According to one embodiment, a radiation detector includes a scintillator layer, a first conductive layer, a second conductive layer, and an organic layer. The second conductive layer is provided between the scintillator layer and the first conductive layer. The organic layer is provided between the first conductive layer and the second conductive layer. The organic layer includes an organic semiconductor region having a first thickness. The first thickness is 400 nanometers or more.

Abstract: According to one embodiment, a radiation detector includes a stacked body. The stacked body includes a first scintillator layer, a first conductive layer, a second conductive layer and an organic semiconductor layer. The second conductive layer is provided between the first scintillator layer and the first conductive layer. The organic semiconductor layer is provided between the first conductive layer and the second conductive layer. The organic semiconductor layer includes a first element. The first element includes at least one selected from the group consisting of boron, gadolinium, helium, lithium, and cadmium.

Abstract: According to one embodiment, a radiation detector includes a scintillator layer, a first conductive layer, a second conductive layer, and an organic layer. The second conductive layer is provided between the scintillator layer and the first conductive layer. The organic layer is provided between the first conductive layer and the second conductive layer. The organic layer includes an organic semiconductor region having a first thickness. The first thickness is 400 nanometers or more.

Abstract: A radiation detection apparatus includes a selecting unit that allows a light having a light emission wavelength and a polarization direction to pass thorough the selecting unit, an optical system that forms an image of the light, a photon detecting unit that observes the image formed by the optical system, and detects the photon in whole range of the entire image, a counting unit that calculates the number of the alpha rays based on a result of counting the photons derived from the light emission of gas excited by the alpha rays, whereby it is possible to sufficiently eliminate background light (noise light) even if background light is strong, and therefore observe weak light emission.

Abstract: An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing 10, an incident window 2, a condenser 3, an optical path changer 4, and a first optical detector 5. The device housing 10 is provided with an opening. The incident window 2 is provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housing 10 enters the inside of the device housing 10 through the incident window 2 with beta rays being blocked, and is condensed by the condenser 3, and the optical path is changed by the optical path changer 4, and subsequently the light is detected by the first optical detector 5. The first optical detector 5 outputs a signal according to the amount of detected light.

Abstract: A muon tracker includes a drift tube detector having a plurality of drift tube arrays, a detection time-difference calculation circuit configured to calculate a detected time-difference between a plurality of time data detected at least two of the drift tubes, a time-difference information database that stores a relationship between a plurality of predetermined tracks of the muon passing the drift tube detector and a predetermined time-difference of possible detected time data to be detected at least two of the drift tubes where each of the plurality of predetermined tracks passes, a time-difference referring circuit configured to refer the detected time-difference calculated at the detection time-difference calculation circuit with the predetermined time-difference stored in the time-difference information database, and a muon track determining circuit configured to determine a muon track as the predetermined track of the muon corresponding to the predetermined time-difference that matches the best with the

Abstract: An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing 10, an incident window 2, a condenser 3, an optical path changer 4, and a first optical detector 5. The device housing 10 is provided with an opening. The incident window 2 is provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housing 10 enters the inside of the device housing 10 through the incident window 2 with beta rays being blocked, and is condensed by the condenser 3, and the optical path is changed by the optical path changer 4, and subsequently the light is detected by the first optical detector 5. The first optical detector 5 outputs a signal according to the amount of detected light.

Abstract: A muon tracker includes a drift tube detector having a plurality of drift tube arrays, a detection time-difference calculation circuit configured to calculate a detected time-difference between a plurality of time data detected at least two of the drift tubes, a time-difference information database that stores a relationship between a plurality of predetermined tracks of the muon passing the drift tube detector and a predetermined time-difference of possible detected time data to be detected at least two of the drift tubes where each of the plurality of predetermined tracks passes, a time-difference referring circuit configured to refer the detected time-difference calculated at the detection time-difference calculation circuit with the predetermined time-difference stored in the time-difference information database, and a muon track determining circuit configured to determine a muon track as the predetermined track of the muon corresponding to the predetermined time-difference that matches the best with the

Abstract: An inner image generating apparatus includes a first receiver configured to receive an inlet track information and a first passage time of a muon, a second receiver configured to receive an outlet track information and a second passage time of the muon, a displacement calculator configured to calculate a track displacement of a track of the muon based on the inlet and outlet track information, a mean energy calculator configured to calculate a mean energy of the muon based on a time-difference between the first passage and the second passage time, a data integration circuit configured to integrate multiplied data multiplying the track displacement and the mean energy on a projected plane, and an image generating circuit configured to generate an inner image of the structure by identifying a position of matter at the projected plane based on an integrated multiplied data.

Abstract: A radiation measurement apparatus includes a radiation sensor that generates a detection signal, a first counter unit that counts the number of the detection signal, an oscillator that generates periodic signal with predetermined period, an AND circuit that outputs logical product obtained by performing AND operation between the detection signal and the periodic signal, a second counter unit that counts the number of a signal output from the AND circuit, and a display unit that displays a value counted by the first counter unit when a value counted by the second counter unit is less than predetermined value and a value being different from the value counted by the first counter unit when the value counted by the second counter unit is not less than predetermined value.

Abstract: A radiation detection apparatus is provided with a detection element group which includes a plurality of detection elements arranged on a support substrate, a shield body of which a pinhole is formed on front surface and a slit is formed on back surface, the shield body putting the detection element group therein, a signal processing substrate which processes a detection signal respectively detected by each detection element, is provided outside of the shield body, and has a dimension being larger than a width of the slit, and a relay substrate which goes through the slit and connects each detection element with the signal processing substrate.

Abstract: A light detecting unit of an alpha ray observation device observes an alpha ray by measuring generated light that is generated by the alpha ray produced in a region of a to-be-measured object. The light detecting unit has a travel direction changing unit that changes the direction of travel of generated light, a light detector that detects direction-changed light, which is the generated light after the direction of travel is changed, and a shielding member that shields the light detector from radiation and has a portion that is provided on the line from the to-be-measured object to the light detector. The shielding member may also surround the perimeter of the light detector and have an opening to allow generated light to reach the travel direction changing unit.

Abstract: An alpha ray observation apparatus, according to an embodiment, that observes alpha rays by detecting alpha ray caused light generated from an alpha ray source in a to-be-observed object, including: an alpha ray caused light wavelength selecting unit that can select light including wavelength of the alpha ray caused light; an alpha ray caused light detecting unit that measures an amount of alpha ray caused light; a short-side wavelength selecting unit that can select light of a short-side wavelength that is shorter than the wavelength of the alpha ray caused light; a short-side wavelength light detecting unit; a long-side wavelength selecting unit that can select light of a long-side wavelength that longer than the wavelength of the alpha ray caused light; a long-side wavelength light detecting unit; and a correction unit that calculates a corrected light amount by correcting the amount of the alpha ray caused light.

Abstract: A light detecting unit of an alpha ray observation device observes an alpha ray by measuring generated light that is generated by the alpha ray produced in a region of a to-be-measured object. The light detecting unit has a travel direction changing unit that changes the direction of travel of generated light, a light detector that detects direction-changed light, which is the generated light after the direction of travel is changed, and a shielding member that shields the light detector from radiation and has a portion that is provided on the line from the to-be-measured object to the light detector. The shielding member may also surround the perimeter of the light detector and have an opening to allow generated light to reach the travel direction changing unit.

Abstract: A radiation measurement apparatus 10 includes a visible image acquisition unit 11 that takes a visible image, a radiation intensity acquisition unit 12 that measures intensity distribution of radiation incoming from a direction being substantially equal to an image picking up direction of the visible image acquisition unit, and an intensity display unit 15A that displays an image acquired by overlaying the intensity distribution of radiation, which is represented by using a plurality of colors being allocated to the intensity distribution of radiation on the visible image.

Abstract: A two-dimensional radiation display device includes: a data acquisition unit that acquires two-dimensional radiation data detected a plurality of times from a plurality of radiation detectors; a data division processing unit that divides the two-dimensional radiation data into data regions of each section of specified direction; an integration processing unit that integrates the two-dimensional radiation data that is detected a plurality of times, for each section of specified direction; a data synthesis processing unit that synthesizes the integration values integrated for each section of specified direction into two-dimensional data including radiation distribution; and an image output unit that outputs two-dimensional data indicating radiation distribution as display data in accordance with a prescribed display format.