Patents by Inventor Naoto Kume

Naoto Kume has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10295681
    Abstract: According to one embodiment, a radiation detector includes a stacked body. The stacked body includes a first scintillator layer, a first conductive layer, a second conductive layer and an organic semiconductor layer. The second conductive layer is provided between the first scintillator layer and the first conductive layer. The organic semiconductor layer is provided between the first conductive layer and the second conductive layer. The organic semiconductor layer includes a first element. The first element includes at least one selected from the group consisting of boron, gadolinium, helium, lithium, and cadmium.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: May 21, 2019
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Satomi Taguchi, Atsushi Wada, Isao Takasu, Naoto Kume, Mitsuyoshi Kobayashi
  • Patent number: 10209371
    Abstract: According to one embodiment, a radiation detector includes a scintillator layer, a first conductive layer, a second conductive layer, and an organic layer. The second conductive layer is provided between the scintillator layer and the first conductive layer. The organic layer is provided between the first conductive layer and the second conductive layer. The organic layer includes an organic semiconductor region having a first thickness. The first thickness is 400 nanometers or more.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: February 19, 2019
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Isao Takasu, Satomi Taguchi, Mitsuyoshi Kobayashi, Atsushi Wada, Yuko Nomura, Keiji Sugi, Rei Hasegawa, Naoto Kume
  • Publication number: 20180156930
    Abstract: According to one embodiment, a radiation detector includes a stacked body. The stacked body includes a first scintillator layer, a first conductive layer, a second conductive layer and an organic semiconductor layer. The second conductive layer is provided between the first scintillator layer and the first conductive layer. The organic semiconductor layer is provided between the first conductive layer and the second conductive layer. The organic semiconductor layer includes a first element. The first element includes at least one selected from the group consisting of boron, gadolinium, helium, lithium, and cadmium.
    Type: Application
    Filed: August 31, 2017
    Publication date: June 7, 2018
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Satomi TAGUCHI, Atsushi WADA, Isao TAKASU, Naoto KUME, Mitsuyoshi KOBAYASHI
  • Publication number: 20180143329
    Abstract: According to one embodiment, a radiation detector includes a scintillator layer, a first conductive layer, a second conductive layer, and an organic layer. The second conductive layer is provided between the scintillator layer and the first conductive layer. The organic layer is provided between the first conductive layer and the second conductive layer. The organic layer includes an organic semiconductor region having a first thickness. The first thickness is 400 nanometers or more.
    Type: Application
    Filed: August 23, 2017
    Publication date: May 24, 2018
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Isao TAKASU, Satomi Taguchi, Mitsuyoshi Kobayashi, Atsushi Wada, Yuko Nomura, Keiji Sugi, Rei Hasegawa, Naoto Kume
  • Patent number: 9927536
    Abstract: A radiation detection apparatus includes a selecting unit that allows a light having a light emission wavelength and a polarization direction to pass thorough the selecting unit, an optical system that forms an image of the light, a photon detecting unit that observes the image formed by the optical system, and detects the photon in whole range of the entire image, a counting unit that calculates the number of the alpha rays based on a result of counting the photons derived from the light emission of gas excited by the alpha rays, whereby it is possible to sufficiently eliminate background light (noise light) even if background light is strong, and therefore observe weak light emission.
    Type: Grant
    Filed: September 25, 2014
    Date of Patent: March 27, 2018
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Hidehiko Kuroda, Kunihiko Nakayama, Kei Takakura, Mikio Izumi, Naoto Kume
  • Patent number: 9910163
    Abstract: An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing 10, an incident window 2, a condenser 3, an optical path changer 4, and a first optical detector 5. The device housing 10 is provided with an opening. The incident window 2 is provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housing 10 enters the inside of the device housing 10 through the incident window 2 with beta rays being blocked, and is condensed by the condenser 3, and the optical path is changed by the optical path changer 4, and subsequently the light is detected by the first optical detector 5. The first optical detector 5 outputs a signal according to the amount of detected light.
    Type: Grant
    Filed: July 23, 2015
    Date of Patent: March 6, 2018
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Naoto Kume, Kei Takakura, Hidehiko Kuroda, Yukio Yoshimura
  • Patent number: 9720113
    Abstract: A muon tracker includes a drift tube detector having a plurality of drift tube arrays, a detection time-difference calculation circuit configured to calculate a detected time-difference between a plurality of time data detected at least two of the drift tubes, a time-difference information database that stores a relationship between a plurality of predetermined tracks of the muon passing the drift tube detector and a predetermined time-difference of possible detected time data to be detected at least two of the drift tubes where each of the plurality of predetermined tracks passes, a time-difference referring circuit configured to refer the detected time-difference calculated at the detection time-difference calculation circuit with the predetermined time-difference stored in the time-difference information database, and a muon track determining circuit configured to determine a muon track as the predetermined track of the muon corresponding to the predetermined time-difference that matches the best with the
    Type: Grant
    Filed: January 14, 2015
    Date of Patent: August 1, 2017
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Kohichi Nakayama, Haruo Miyadera, Kenichi Yoshioka, Tsukasa Sugita, Naoto Kume, Yuichiro Ban
  • Publication number: 20170205513
    Abstract: An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing 10, an incident window 2, a condenser 3, an optical path changer 4, and a first optical detector 5. The device housing 10 is provided with an opening. The incident window 2 is provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housing 10 enters the inside of the device housing 10 through the incident window 2 with beta rays being blocked, and is condensed by the condenser 3, and the optical path is changed by the optical path changer 4, and subsequently the light is detected by the first optical detector 5. The first optical detector 5 outputs a signal according to the amount of detected light.
    Type: Application
    Filed: July 23, 2015
    Publication date: July 20, 2017
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Naoto KUME, Kei TAKAKURA, Hidehiko KURODA, Yukio YOSHIMURA
  • Publication number: 20160377747
    Abstract: A muon tracker includes a drift tube detector having a plurality of drift tube arrays, a detection time-difference calculation circuit configured to calculate a detected time-difference between a plurality of time data detected at least two of the drift tubes, a time-difference information database that stores a relationship between a plurality of predetermined tracks of the muon passing the drift tube detector and a predetermined time-difference of possible detected time data to be detected at least two of the drift tubes where each of the plurality of predetermined tracks passes, a time-difference referring circuit configured to refer the detected time-difference calculated at the detection time-difference calculation circuit with the predetermined time-difference stored in the time-difference information database, and a muon track determining circuit configured to determine a muon track as the predetermined track of the muon corresponding to the predetermined time-difference that matches the best with the
    Type: Application
    Filed: January 14, 2015
    Publication date: December 29, 2016
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Kohichi NAKAYAMA, Haruo MIYADERA, Kenichi YOSHIOKA, Tsukasa SUGITA, Naoto KUME, Yuichiro BAN
  • Patent number: 9423361
    Abstract: An inner image generating apparatus includes a first receiver configured to receive an inlet track information and a first passage time of a muon, a second receiver configured to receive an outlet track information and a second passage time of the muon, a displacement calculator configured to calculate a track displacement of a track of the muon based on the inlet and outlet track information, a mean energy calculator configured to calculate a mean energy of the muon based on a time-difference between the first passage and the second passage time, a data integration circuit configured to integrate multiplied data multiplying the track displacement and the mean energy on a projected plane, and an image generating circuit configured to generate an inner image of the structure by identifying a position of matter at the projected plane based on an integrated multiplied data.
    Type: Grant
    Filed: January 14, 2015
    Date of Patent: August 23, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Tsukasa Sugita, Haruo Miyadera, Kenichi Yoshioka, Naoto Kume, Kohichi Nakayama, Yuichiro Ban, Yoshiji Karino, Kyouichi Fujita, Shigeru Odanaka
  • Patent number: 9383455
    Abstract: A radiation measurement apparatus includes a radiation sensor that generates a detection signal, a first counter unit that counts the number of the detection signal, an oscillator that generates periodic signal with predetermined period, an AND circuit that outputs logical product obtained by performing AND operation between the detection signal and the periodic signal, a second counter unit that counts the number of a signal output from the AND circuit, and a display unit that displays a value counted by the first counter unit when a value counted by the second counter unit is less than predetermined value and a value being different from the value counted by the first counter unit when the value counted by the second counter unit is not less than predetermined value.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: July 5, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Shunichiro Makino, Toru Onodera, Yoshinori Satoh, Naoto Kume
  • Patent number: 9285490
    Abstract: A radiation detection apparatus is provided with a detection element group which includes a plurality of detection elements arranged on a support substrate, a shield body of which a pinhole is formed on front surface and a slit is formed on back surface, the shield body putting the detection element group therein, a signal processing substrate which processes a detection signal respectively detected by each detection element, is provided outside of the shield body, and has a dimension being larger than a width of the slit, and a relay substrate which goes through the slit and connects each detection element with the signal processing substrate.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: March 15, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Naoto Kume, Toru Onodera, Yoshinori Satoh, Shunichiro Makino
  • Patent number: 9279889
    Abstract: A light detecting unit of an alpha ray observation device observes an alpha ray by measuring generated light that is generated by the alpha ray produced in a region of a to-be-measured object. The light detecting unit has a travel direction changing unit that changes the direction of travel of generated light, a light detector that detects direction-changed light, which is the generated light after the direction of travel is changed, and a shielding member that shields the light detector from radiation and has a portion that is provided on the line from the to-be-measured object to the light detector. The shielding member may also surround the perimeter of the light detector and have an opening to allow generated light to reach the travel direction changing unit.
    Type: Grant
    Filed: January 30, 2014
    Date of Patent: March 8, 2016
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Naoto Kume, Hidehiko Kuroda, Kunihiko Nakayama, Kei Takakura
  • Publication number: 20150369932
    Abstract: An alpha ray observation apparatus, according to an embodiment, that observes alpha rays by detecting alpha ray caused light generated from an alpha ray source in a to-be-observed object, including: an alpha ray caused light wavelength selecting unit that can select light including wavelength of the alpha ray caused light; an alpha ray caused light detecting unit that measures an amount of alpha ray caused light; a short-side wavelength selecting unit that can select light of a short-side wavelength that is shorter than the wavelength of the alpha ray caused light; a short-side wavelength light detecting unit; a long-side wavelength selecting unit that can select light of a long-side wavelength that longer than the wavelength of the alpha ray caused light; a long-side wavelength light detecting unit; and a correction unit that calculates a corrected light amount by correcting the amount of the alpha ray caused light.
    Type: Application
    Filed: February 12, 2014
    Publication date: December 24, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Naoto KUME, Hidehiko KURODA, Kunihiko NAKAYAMA, Kei TAKAKURA
  • Publication number: 20150323681
    Abstract: A light detecting unit of an alpha ray observation device observes an alpha ray by measuring generated light that is generated by the alpha ray produced in a region of a to-be-measured object. The light detecting unit has a travel direction changing unit that changes the direction of travel of generated light, a light detector that detects direction-changed light, which is the generated light after the direction of travel is changed, and a shielding member that shields the light detector from radiation and has a portion that is provided on the line from the to-be-measured object to the light detector. The shielding member may also surround the perimeter of the light detector and have an opening to allow generated light to reach the travel direction changing unit.
    Type: Application
    Filed: January 30, 2014
    Publication date: November 12, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Naoto KUME, Hidehiko KURODA, Kunihiko NAKAYAMA, Kei TAKAKURA
  • Patent number: 9170339
    Abstract: A radiation measurement apparatus 10 includes a visible image acquisition unit 11 that takes a visible image, a radiation intensity acquisition unit 12 that measures intensity distribution of radiation incoming from a direction being substantially equal to an image picking up direction of the visible image acquisition unit, and an intensity display unit 15A that displays an image acquired by overlaying the intensity distribution of radiation, which is represented by using a plurality of colors being allocated to the intensity distribution of radiation on the visible image.
    Type: Grant
    Filed: December 13, 2012
    Date of Patent: October 27, 2015
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Yoshinori Satoh, Toru Onodera, Naoto Kume, Shunichiro Makino, Tetsuro Aikawa
  • Patent number: 9086498
    Abstract: A two-dimensional radiation display device includes: a data acquisition unit that acquires two-dimensional radiation data detected a plurality of times from a plurality of radiation detectors; a data division processing unit that divides the two-dimensional radiation data into data regions of each section of specified direction; an integration processing unit that integrates the two-dimensional radiation data that is detected a plurality of times, for each section of specified direction; a data synthesis processing unit that synthesizes the integration values integrated for each section of specified direction into two-dimensional data including radiation distribution; and an image output unit that outputs two-dimensional data indicating radiation distribution as display data in accordance with a prescribed display format.
    Type: Grant
    Filed: December 26, 2012
    Date of Patent: July 21, 2015
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Naoto Kume, Toru Onodera, Yoshinori Satoh, Shunichiro Makino, Tatsuyuki Maekawa, Tsukasa Teramura
  • Publication number: 20150198542
    Abstract: An inner image generating apparatus includes a first receiver configured to receive an inlet track information and a first passage time of a muon, a second receiver configured to receive an outlet track information and a second passage time of the muon, a displacement calculator configured to calculate a track displacement of a track of the muon based on the inlet and outlet track information, a mean energy calculator configured to calculate a mean energy of the muon based on a time-difference between the first passage and the second passage time, a data integration circuit configured to integrate multiplied data multiplying the track displacement and the mean energy on a projected plane, and an image generating circuit configured to generate an inner image of the structure by identifying a position of matter at the projected plane based on an integrated multiplied data.
    Type: Application
    Filed: January 14, 2015
    Publication date: July 16, 2015
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Tsukasa SUGITA, Haruo MIYADERA, Kenichi YOSHIOKA, Naoto KUME, Kohichi NAKAYAMA, Yuichiro BAN, Yoshiji KARINO, Kyouichi FUJITA, Shigeru ODANAKA
  • Publication number: 20150117613
    Abstract: A radiation measurement apparatus 10 includes a visible image acquisition unit 11 that takes a visible image, a radiation intensity acquisition unit 12 that measures intensity distribution of radiation incoming from a direction being substantially equal to an image picking up direction of the visible image acquisition unit, and an intensity display unit 15A that displays an image acquired by overlaying the intensity distribution of radiation, which is represented by using a plurality of colors being allocated to the intensity distribution of radiation on the visible image.
    Type: Application
    Filed: December 13, 2012
    Publication date: April 30, 2015
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Yoshinori Satoh, Toru Onodera, Naoto Kume, Shunichiro Makino, Tetsuro Aikawa
  • Publication number: 20150090889
    Abstract: A radiation detection apparatus includes a selecting unit that allows a light having a light emission wavelength and a polarization direction to pass thorough the selecting unit, an optical system that forms an image of the light, a photon detecting unit that observes the image formed by the optical system, and detects the photon in whole range of the image, a counting unit that calculates the number of the alpha ray based on a result of counting the photon derived from the light emission of gas excited by the alpha ray, and is possible to sufficiently eliminate background light (noise light) even if background light is strong, and therefore observe weak light emission.
    Type: Application
    Filed: September 25, 2014
    Publication date: April 2, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Hidehiko KURODA, Kunihiko NAKAYAMA, Kei TAKAKURA, Mikio IZUMI, Naoto KUME