Patents by Inventor Naoto Miki
Naoto Miki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9335168Abstract: A surveying instrument which comprises a rotation unit 7 adapted to direct a distance measuring optical axis to an object to be measured and the rotary drive unit 5 rotates the rotation unit, comprising a rotary motor for rotating an output shaft 6 and a clutch unit for connecting or disconnecting the rotary motor and the output shaft, wherein the rotary motor and the clutch unit are arranged in a series along the output shaft, and the output shaft is fixed to the rotation unit.Type: GrantFiled: January 6, 2014Date of Patent: May 10, 2016Assignee: Kabushiki Kaisha TOPCONInventors: Jun-ichi Kodaira, Naoto Miki
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Publication number: 20140196293Abstract: A surveying instrument which comprises a rotation unit 7 adapted to direct a distance measuring optical axis to an object to be measured and the rotary drive unit 5 rotates the rotation unit, comprising a rotary motor for rotating an output shaft 6 and a clutch unit for connecting or disconnecting the rotary motor and the output shaft, wherein the rotary motor and the clutch unit are arranged in a series along the output shaft, and the output shaft is fixed to the rotation unit.Type: ApplicationFiled: January 6, 2014Publication date: July 17, 2014Applicant: Kabushiki Kaisha TOPCONInventors: Jun-ichi Kodaira, Naoto Miki
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Patent number: 8179522Abstract: A distance measuring device measures a distance from a phase difference of beaten down processing signals even when fluctuations occur in a frequency of an oscillator. The distance measuring device includes a laser unit, a dividing device, a reference light receiving unit, and a measuring light receiving unit. The distance measuring device further includes an oscillator, a first mixer, a second mixer, a fourth filter, a fifth filter, a third mixer, a sixth filter, a second filter, a phase difference measuring unit, and a distance measuring unit. The phase difference measuring unit measures a phase difference of the two beat signals extracted by the sixth filter and the second filter. The distance measuring unit measures a distance based on the phase difference measured by the phase difference measuring unit.Type: GrantFiled: September 1, 2011Date of Patent: May 15, 2012Assignee: Kabushiki Kaisha TopconInventors: Isao Minegishi, Masahiro Ohishi, Naoto Miki, Yuichi Yoshimura
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Publication number: 20120033197Abstract: A distance measuring device measures a distance from a phase difference of beaten down processing signals even when fluctuations occur in a frequency of an oscillator. The distance measuring device includes a laser unit, a dividing device, a reference light receiving unit, and a measuring light receiving unit. The distance measuring device further includes an oscillator, a first mixer, a second mixer, a fourth filter, a fifth filter, a third mixer, a sixth filter, a second filter, a phase difference measuring unit, and a distance measuring unit. The phase difference measuring unit measures a phase difference of the two beat signals extracted by the sixth filter and the second filter. The distance measuring unit measures a distance based on the phase difference measured by the phase difference measuring unit.Type: ApplicationFiled: September 1, 2011Publication date: February 9, 2012Inventors: Isao Minegishi, Masahiro Ohishi, Naoto Miki, Yuichi Yoshimura
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Patent number: 7474388Abstract: The present invention provides a distance measuring device, which comprises a light projecting unit for projecting a distance measuring light (22) to an object to be measured, a reference reflection unit (55) provided relatively movable and arranged at a known position so as to traverse the projected distance measuring light, a photodetection unit (7) for receiving a reflection light from the object to be measured as a reflected distance measuring light (22?) and a reflection light from said reference reflection unit as an internal reference light (22?), and a control arithmetic unit (15) for calculating a distance to the object to be measured based on a photodetection signal relating to the reflected distance measuring light and based on a photodetection signal relating to the internal reference light.Type: GrantFiled: May 10, 2006Date of Patent: January 6, 2009Assignee: Kabushiki Kaisha TOPCONInventors: Fumio Ohtomo, Naoto Miki
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Patent number: 7330308Abstract: An alignment method of micro-alignment members includes a first step for moving a reticle, which is movably disposed between a first position and a second position, to face a first microscope in the first position, and for aligning a center of the reticle with an optical axis of the first microscope while observing the reticle by the first microscope, a second step for moving the reticle to the second position to face a second microscope in the second position, and for aligning the center of the reticle with an optical axis of the second microscope while observing the reticle by the second microscope, a third step for disposing a first micro-alignment member such that a center of the first micro-alignment member aligns with the optical axis of the second microscope, and a fourth step for disposing a second micro-alignment member instead of the reticle to face the first micro-alignment member.Type: GrantFiled: March 8, 2005Date of Patent: February 12, 2008Assignee: Kabushiki Kaisha TOPCONInventors: Noriyasu Kiryu, Naoto Miki
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Publication number: 20070263202Abstract: The present invention provides a distance measuring device, which comprises a light projecting unit for projecting a distance measuring light (22) to an object to be measured, a reference reflection unit (55) provided relatively movable and arranged at a known position so as to traverse the projected distance measuring light, a photodetection unit (7) for receiving a reflection light from the object to be measured as a reflected distance measuring light (22?) and a reflection light from said reference reflection unit as an internal reference light (22?), and a control arithmetic unit (15) for calculating a distance to the object to be measured based on a photodetection signal relating to the reflected distance measuring light and based on a photodetection signal relating to the internal reference light.Type: ApplicationFiled: May 10, 2006Publication date: November 15, 2007Inventors: Fumio Ohtomo, Naoto Miki
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Patent number: 7064820Abstract: A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are coated by changing a photodetection polarizing angle by the photodetection polarizing angle changing means, and the step of performing surface inspection by setting the photodetection polarizing angle to a condition where an S/N ratio of photodetection output is at the highest.Type: GrantFiled: March 21, 2003Date of Patent: June 20, 2006Assignee: Kabushiki Kaisha TOPCONInventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Hiroyuki Maekawa, Naohiro Takahashi
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Publication number: 20050200981Abstract: An alignment method of micro-alignment members includes a first step for moving a reticle, which is movably disposed between a first position and a second position, to face a first microscope in the first position, and for aligning a center of the reticle with an optical axis of the first microscope while observing the reticle by the first microscope, a second step for moving the reticle to the second position to face a second microscope in the second position, and for aligning the center of the reticle with an optical axis of the second microscope while observing the reticle by the second microscope, a third step for disposing a first micro-alignment member such that a center of the first micro-alignment member aligns with the optical axis of the second microscope, and a fourth step for disposing a second micro-alignment member instead of the reticle to face the first micro-alignment member.Type: ApplicationFiled: March 8, 2005Publication date: September 15, 2005Applicant: Kabushiki Kaisha TOPCONInventors: Noriyasu Kiryu, Naoto Miki
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Publication number: 20030184744Abstract: A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are coated by changing a photodetection polarizing angle by the photodetection polarizing angle changing means, and the step of performing surface inspection by setting the photodetection polarizing angle to a condition where an S/N ratio of photodetection output is at the highest.Type: ApplicationFiled: March 21, 2003Publication date: October 2, 2003Inventors: Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Hiroyuki Maekawa, Naohiro Takahashi
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Patent number: 6104481Abstract: A wafer surface inspection apparatus comprises a light source, an optical system for focusing the light beams from the light source onto the wafer surface, a scanning means for scanning the focused point over a predetermined range on the wafer surface, a photo detector including an photoelectric converter for sensing scattered light from the focused point, and a signal detector for detecting signals from the photo detector, in which the light source is a light source for emitting two different wavelengths, the optical system is adapted to focus the light beams of the two wavelengths on one and the same point on the wafer surface, and the photo detector is adapted to sense the two wavelengths separately, and further comprises a discriminating portion for discriminating between a foreign matter or a scratch on the wafer surface and a recess in a spot form existing on the wafer surface by utilizing outputs from the signal detector.Type: GrantFiled: November 2, 1998Date of Patent: August 15, 2000Assignee: Kabushiki Kaisha TopconInventors: Akihiko Sekine, Yoichiro Iwa, Hiroaki Soma, Naoto Miki, Hisashi Isozaki, Hisakazu Yoshino