Patents by Inventor Naoto MIZUTANI

Naoto MIZUTANI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Exhaust gas analysis apparatus, exhaust gas analysis method, and correction expression creation method
    Patent number: 11168629
    Abstract: The present invention is one that accurately measures an exhaust gas component regardless of variation in atmospheric pressure around a test object that is a vehicle or part of it, and an exhaust gas analysis apparatus that measures component concentration in exhaust gas discharged from the test object that is the vehicle or part of it. The exhaust gas analysis apparatus includes: an exhaust gas detector that mixes the exhaust gas and reactive gas together and detects the resulting phenomenon; a pressure gauge that measures the atmospheric pressure at the time of measurement of the exhaust gas or pressure at a predetermined point inside the exhaust gas analysis apparatus as measured pressure; and a correction part that, on the basis of the measured pressure by the pressure gauge, corrects the measurement error of the exhaust gas detector associated with a variation in the supply amount of the reactive gas.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: November 9, 2021
    Assignee: HORIBA, LTD.
    Inventors: Naoto Mizutani, Masahiro Nishikawa, Haruhisa Mohara, Shun Fukami, Yosuke Kondo
  • Calibration method for gas analysis apparatus, gas analysis system, and pressure varying device
    Patent number: 10955398
    Abstract: The present invention includes: connecting a pressure varying device to a sample gas introduction port and a gas discharge port of a gas analysis apparatus; depressurizing or pressurizing the sample gas introduction port and the gas discharge port by the pressure varying device; introducing calibration gas from a calibration gas introduction port of the gas analysis apparatus in a depressurized or pressurized state; and calculating a pressure correction factor for the gas analysis apparatus with use of a measurement result of the calibration gas by the gas analysis apparatus.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: March 23, 2021
    Assignee: HORIBA, LTD.
    Inventors: Naoto Mizutani, Takeshi Kusaka, Haruhisa Mohara, Masayoshi Shinohara
  • CALIBRATION METHOD FOR GAS ANALYSIS APPARATUS, GAS ANALYSIS SYSTEM, AND PRESSURE VARYING DEVICE
    Publication number: 20190137465
    Abstract: The present invention includes: connecting a pressure varying device to a sample gas introduction port and a gas discharge port of a gas analysis apparatus; depressurizing or pressurizing the sample gas introduction port and the gas discharge port by the pressure varying device; introducing calibration gas from a calibration gas introduction port of the gas analysis apparatus in a depressurized or pressurized state; and calculating a pressure correction factor for the gas analysis apparatus with use of a measurement result of the calibration gas by the gas analysis apparatus.
    Type: Application
    Filed: November 6, 2018
    Publication date: May 9, 2019
    Applicant: HORIBA, Ltd.
    Inventors: Naoto MIZUTANI, Takeshi KUSAKA, Haruhisa MOHARA, Masayoshi SHINOHARA