Patents by Inventor Naoto Ohtake
Naoto Ohtake has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9506143Abstract: The problems in accordance with the present invention are: to provide a DLC film, wherein a protective film having a segmented shape is easily formed, quality control of the protective film is improved, segmented shapes with a high degree of freedom (that are complicated) are possible, and the application of the DLC film is possible not only to two-dimensional shapes but also to three-dimensional shapes; and to provide a method for forming the DLC film. As solutions to the problems, there are provided a protective film and a method for producing the protective film, characterized by, when forming on a substrate the protective film having a segmented shape formed by depositing a film so that the film is formed divided into segments, masking the substrate using a drawing material so that segments having predetermined shapes are obtained, thereafter depositing the protective film, and then removing the masked part to form a spacing between segments.Type: GrantFiled: September 10, 2010Date of Patent: November 29, 2016Assignee: IMOTT INC.Inventors: Naoto Ohtake, Makoto Matsuo, Yoshinao Iwamoto
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Patent number: 8771724Abstract: Provided are a percutaneous absorption enhancer excellent in an enhancing effect on percutaneous absorption of a wide range of drugs and excellent in compatibility with an adhesive base, and a transdermal preparation using the percutaneous absorption enhancer. The percutaneous absorption enhancer includes a sulfosuccinate or a salt thereof and an alkyl glycoside or an alkyl thioglycoside.Type: GrantFiled: June 22, 2009Date of Patent: July 8, 2014Assignee: TOA EIYO Ltd.Inventors: Naoto Ohtake, Yuuki Koide
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Publication number: 20120189823Abstract: The problems in accordance with the present invention are: to provide a DLC film, wherein a protective film having a segmented shape is easily formed, quality control of the protective film is improved, segmented shapes with a high degree of freedom (that are complicated) are possible, and the application of the DLC film is possible not only to two-dimensional shapes but also to three-dimensional shapes; and to provide a method for forming the DLC film. As solutions to the problems, there are provided a protective film and a method for producing the protective film, characterized by, when forming on a substrate the protective film having a segmented shape formed by depositing a film so that the film is formed divided into segments, masking the substrate using a drawing material so that segments having predetermined shapes are obtained, thereafter depositing the protective film, and then removing the masked part to form a spacing between segments.Type: ApplicationFiled: September 10, 2010Publication date: July 26, 2012Inventors: Naoto Ohtake, Makoto Matsuo, Yoshinao Iwamoto
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Publication number: 20110104241Abstract: Provided are a percutaneous absorption enhancer excellent in an enhancing effect on percutaneous absorption of a wide range of drugs and excellent in compatibility with an adhesive base, and a transdermal preparation using the percutaneous absorption enhancer. The percutaneous absorption enhancer includes a sulfosuccinate or a salt thereof and an alkyl glycoside or an alkyl thioglycoside.Type: ApplicationFiled: June 22, 2009Publication date: May 5, 2011Applicant: TOA EIYO LTD.Inventors: Naoto Ohtake, Yuuki Koide
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Publication number: 20110045208Abstract: The present invention relates to a diamond-like carbon film forming apparatus and a method of forming a diamond-like carbon film. A diamond-like carbon film forming apparatus using plasma chemical vapor deposition of the present invention is provided with a member (4) comprised of a substrate (2) surrounded by a conductive mask material (3) and a DC single pulse power supply (6) and superimposition DC power supply (26) and/or high frequency power supply (7) for supplying power voltage with the wall of the chamber (5) of the diamond-like carbon film forming apparatus, which apparatus selects and applies to the member (4) either a negative single pulse voltage from the DC single pulse power supply (6) and said superimposition DC power supply (26) or a high frequency voltage of the high frequency power supply (7) so as to form a segment structure diamond-like carbon film on the substrate (2) surrounded by the mask material (3).Type: ApplicationFiled: February 10, 2009Publication date: February 24, 2011Applicant: IMOTT INC.Inventors: Naoto Ohtake, Makoto Matsuo, Yoshinao Iwamoto
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Patent number: 7883750Abstract: An object of the present invention is to provide a method of forming a thin film of excellent quality by generating discharge plasma using gaseous raw material including a carbon source under an atmosphere of a relatively high pressure of 100 Torr or higher. A substrate 6 is mounted on at least one of opposing electrodes 4 and 5. A pulse voltage is applied on the opposing electrodes 4 and 5 under a pressure of 100 to 1600 Torr in an atmosphere containing gaseous raw material “A” including a carbon source to generate discharge plasma. A thin film 7 is thus formed on the substrate 6. The pulse voltage has a pulse duration of 10 to 1000 nsec.Type: GrantFiled: February 10, 2004Date of Patent: February 8, 2011Assignee: NGK Insulators, Ltd.Inventors: Takao Saito, Yukinori Nakamura, Yoshimasa Kondo, Naoto Ohtake
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Publication number: 20080282981Abstract: An object of the present invention is to form a thin film reproducibly in a process for forming the thin film on the inner wall surface facing a space formed in a substrate by plasma CVD. A thin film 22 is produced on an inner wall surface 20b of a substrate 20 facing a space 23 formed in the substrate 20. The substrate 20 is contained in a chamber for plasma CVD process. A gas for plasma reaction is then flown into the space 23 and a pulse voltage is applied on the substrate 20 without substantially applying a direct bias voltage on the substrate 20 to form the thin film on the inner wall surface 20b.Type: ApplicationFiled: October 19, 2007Publication date: November 20, 2008Applicant: NGK Insulators, Ltd.Inventors: Takao Saito, Yukinori Nakamura, Yoshimasa Kondo, Naoto Ohtake
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Patent number: 7303789Abstract: Methods are provided to form a thin film reproducibly in a process for forming the thin film on the inner wall surface facing a space formed in a substrate by plasma CVD. A thin film is produced on an inner wall surface of a substrate facing a space formed in the substrate. The substrate is contained in a chamber for plasma CVD process. A gas for plasma reaction is then flown into the space and a pulse voltage is applied on the substrate without substantially applying a direct bias voltage on the substrate to form the thin film on the inner wall surface.Type: GrantFiled: January 30, 2004Date of Patent: December 4, 2007Assignee: NGK Insulators, Ltd.Inventors: Takao Saito, Yukinori Nakamura, Yoshimasa Kondo, Naoto Ohtake
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Publication number: 20040182323Abstract: An object of the present invention is to form a thin film reproducibly in a process for forming the thin film on the inner wall surface facing a space formed in a substrate by plasma CVD. A thin film 22 is produced on an inner wall surface 20b of a substrate 20 facing a space 23 formed in the substrate 20. The substrate 20 is contained in a chamber for plasma CVD process. A gas for plasma reaction is then flown into the space 23 and a pulse voltage is applied on the substrate 20 without substantially applying a direct bias voltage on the substrate 20 to form the thin film on the inner wall surface 20b.Type: ApplicationFiled: January 30, 2004Publication date: September 23, 2004Applicant: NGK INSULATORS, LTD.Inventors: Takao Saito, Yukinori Nakamura, Yoshimasa Kondo, Naoto Ohtake
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Publication number: 20040161534Abstract: An object of the present invention is to provide a method of forming a thin film of excellent quality by generating discharge plasma using gaseous raw material including a carbon source under an atmosphere of a relatively high pressure of 100 Torr or higher. A substrate 6 is mounted on at least one of opposing electrodes 4 and 5. A pulse voltage is applied on the opposing electrodes 4 and 5 under a pressure of 100 to 1600 Torr in an atmosphere containing gaseous raw material “A” including a carbon source to generate discharge plasma. A thin film 7 is thus formed on the substrate 6. The pulse voltage has a pulse duration of 10 to 1000 nsec.Type: ApplicationFiled: February 10, 2004Publication date: August 19, 2004Applicant: NGK Insulators, Ltd.Inventors: Takao Saito, Yukinori Nakamura, Yoshimasa Kondo, Naoto Ohtake
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Publication number: 20030077883Abstract: To provide a deposition method and a deposition apparatus, in which deposition can be performed under a low temperature and a substrate does not suffer from charge-up damage, and a semiconductor device produced thereby.Type: ApplicationFiled: August 29, 2002Publication date: April 24, 2003Inventor: Naoto Ohtake