Patents by Inventor Naoyuki Taketomi

Naoyuki Taketomi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10162041
    Abstract: When measurement is conducted using a measurement system utilizing a tracking-type laser interferometer, laser light is emitted at a retroreflector, the tracking-type laser interferometer is placed in a tracking state, and a displacement body is displaced to a desired point and a combination of position data of the displacement body at a single desired location and rotation position data of a biaxial rotation mechanism from the tracking-type laser interferometer is stored. When a received light determiner determines that there is an abnormality in an amount of light, the positions of the displacement body and the biaxial rotation mechanism are maintained, and the displacement body and biaxial rotation mechanism are displaced to the respective stored, predetermined positions. When the abnormality in the amount of received light is eliminated after displacement, the tracking-type laser interferometer is placed in the tracking state and measurement is restarted.
    Type: Grant
    Filed: April 11, 2016
    Date of Patent: December 25, 2018
    Assignee: MITUTOYO CORPORATION
    Inventor: Naoyuki Taketomi
  • Publication number: 20160313436
    Abstract: When measurement is conducted using a measurement system utilizing a tracking-type laser interferometer, laser light is emitted at a retroreflector, the tracking-type laser interferometer is placed in a tracking state, and a displacement body is displaced to a desired point and a combination of position data of the displacement body at a single desired location and rotation position data of a biaxial rotation mechanism from the tracking-type laser interferometer is stored. When a received light determiner determines that there is an abnormality in an amount of light, the positions of the displacement body and the biaxial rotation mechanism are maintained, and the displacement body and biaxial rotation mechanism are displaced to the respective stored, predetermined positions. When the abnormality in the amount of received light is eliminated after displacement, the tracking-type laser interferometer is placed in the tracking state and measurement is restarted.
    Type: Application
    Filed: April 11, 2016
    Publication date: October 27, 2016
    Applicant: MITUTOYO CORPORATION
    Inventor: Naoyuki TAKETOMI
  • Patent number: 7872733
    Abstract: A tracking type laser interferometer that detects displacement of a retroreflector 300 being an object to be measured by utilizing interference of a laser beam 102 irradiated onto the retroreflector 300 and reflected by the retroreflector 300 in the returning direction, and carries out tracking by means of a two-axis turning mechanism 240 using displacement in the position of the optical axis of the laser beam 102; the same tracking type laser interferometer, includes; a light irradiator 600 that emits a fan-shaped laser light 602 that is fan-shaped including the optical axis of the laser beam 102, is interlocked with turning movements of the two-axis turning mechanism 240 around an axis orthogonal to the center axis of the corresponding fan shape; and a light receptor 620 that has a specific positional relationship with the retroreflector 300 or the light irradiator 600 and receives the fan-shaped laser light.
    Type: Grant
    Filed: June 18, 2008
    Date of Patent: January 18, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Naoyuki Taketomi, Sinichirou Yanaka
  • Patent number: 7599070
    Abstract: An optical axis polarization type laser interferometer including a reference sphere which forms a reference of measurement, a retro-reflecting means disposed at a measurement object, a laser interference measuring apparatus for outputting a measurement value corresponding to an increase or a decrease in the distance to and from the retro-reflecting means; and a two-axis turning mechanism for turning an emission beam of the corresponding laser interference measuring apparatus centering around the reference sphere, which measures, with the center coordinates of the reference sphere used as the reference, the distance to and from the retro-reflecting means where the optical axes of the emission beam from the laser interference measuring apparatus mounted on the two-axis turning mechanism and a return beam become parallel to each other, wherein the fixing portion of the first axis turning mechanism installed at the base part of the apparatus is disposed at the inner circumference thereof, the reference sphere is
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: October 6, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Naoyuki Taketomi, Makoto Abbe
  • Patent number: 7538888
    Abstract: A method for estimating an absolute distance between a tracking laser interferometer and a retroreflector is provided. The tracking laser interferometer includes the retroreflector for reflecting and returning an incident measurement light in an incident direction and a two-axis rotating mechanism for rotationally moving in an exit direction of the measurement light so that optical axes of the measurement light and return light are collimated.
    Type: Grant
    Filed: May 8, 2007
    Date of Patent: May 26, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Shinichi Hara, Naoyuki Taketomi, Makoto Abbe
  • Publication number: 20080316497
    Abstract: A tracking type laser interferometer that detects displacement of a retroreflector 300 being an object to be measured by utilizing interference of a laser beam 102 irradiated onto the retroreflector 300 and reflected by the retroreflector 300 in the returning direction, and carries out tracking by means of a two-axis turning mechanism 240 using displacement in the position of the optical axis of the laser beam 102; the same tracking type laser interferometer, includes; a light irradiator 600 that emits a fan-shaped laser light 602 that is fan-shaped including the optical axis of the laser beam 102, is interlocked with turning movements of the two-axis turning mechanism 240 around an axis orthogonal to the center axis of the corresponding fan shape; and a light receptor 620 that has a specific positional relationship with the retroreflector 300 or the light irradiator 600 and receives the fan-shaped laser light.
    Type: Application
    Filed: June 18, 2008
    Publication date: December 25, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Naoyuki Taketomi, Sinichirou Yanaka
  • Publication number: 20080198387
    Abstract: An optical axis polarization type laser interferometer including a reference sphere which forms a reference of measurement, a retro-reflecting means disposed at a measurement object, a laser interference measuring apparatus for outputting a measurement value corresponding to an increase or a decrease in the distance to and from the retro-reflecting means; and a two-axis turning mechanism for turning an emission beam of the corresponding laser interference measuring apparatus centering around the reference sphere, which measures, with the center coordinates of the reference sphere used as the reference, the distance to and from the retro-reflecting means where the optical axes of the emission beam from the laser interference measuring apparatus mounted on the two-axis turning mechanism and a return beam become parallel to each other, wherein the fixing portion of the first axis turning mechanism installed at the base part of the apparatus is disposed at the inner circumference thereof, the reference sphere is
    Type: Application
    Filed: February 14, 2008
    Publication date: August 21, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Naoyuki Taketomi, Makoto Abbe
  • Patent number: 7408650
    Abstract: An optical-axis deflection type laser interferometer includes a reference ball serving as a measurement reference, a retroreflecting means disposed at an object to be measured, a laser interferometer length measuring apparatus outputting a measurement value between the apparatus and the retroreflecting means, and a rotational mechanism that rotates a beam projected from the laser interferometer length measuring apparatus around the reference ball. The laser interferometer additionally includes a displacement gauge that measures an error caused by a relative motion between the reference ball and the laser interferometer length measuring apparatus, and a rectilinear movement mechanism that displaces these in a direction of an optical axis of a measurement beam with respect to the reference ball while maintaining a relative positional relationship between the laser interferometer length measuring apparatus and the displacement gauge.
    Type: Grant
    Filed: August 21, 2007
    Date of Patent: August 5, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Yasushi Ueshima, Naoyuki Taketomi, Makoto Abbe
  • Patent number: 7388674
    Abstract: A laser tracking interferometer directs a laser beam to a retroreflector serving as an object to be measured to sense a displacement of the retroreflector using interference with a laser beam back reflected from the retroreflector. The laser tracking interferometer includes: a reference sphere; a carriage that rotates about a center of the reference sphere; a laser interferometer; a displacement gage for providing a displacement signal corresponding to a relative displacement between the reference sphere and the displacement gage; a data processing apparatus for computing a displacement of the retroreflector; a position sensitive detector for providing a position signal corresponding to deviation of a laser beam; and a controller for controlling rotation of the carriage based on the position signal so that the amount of deviation becomes zero.
    Type: Grant
    Filed: July 19, 2006
    Date of Patent: June 17, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Shinichirou Yanaka, Makoto Abe, Shinichi Hara, Naoyuki Taketomi
  • Publication number: 20080049211
    Abstract: An optical-axis deflection type laser interferometer includes a reference ball serving as a measurement reference, a retroreflecting means disposed at an object to be measured, a laser interferometer length measuring apparatus that outputs a measurement value according to an increase or a decrease in distance between the apparatus and the retroreflecting means, and a rotational mechanism that rotates a beam projected from the laser interferometer length measuring apparatus around the reference ball. The thus structured laser interferometer measures a distance between the laser interferometer and the retroreflecting means that makes an optical axis of an outgoing beam projected from the laser interferometer length measuring apparatus mounted on the rotational mechanism and an optical axis of a return beam returned to the laser interferometer length measuring apparatus parallel to each other, based on center coordinates of the reference ball.
    Type: Application
    Filed: August 21, 2007
    Publication date: February 28, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Yasushi Ueshima, Naoyuki Taketomi, Makoto Abbe
  • Publication number: 20070268494
    Abstract: To provide a method for estimating an absolute distance L between a tracking laser interferometer and a retroreflector 70, the tracking laser interferometer including; the retroreflector 70 for reflecting and returning incident measurement light A in an incident direction; and a two-axis rotating mechanism 40 for rotationally moving in an exit direction of the measurement light A so that optical axes of the measurement light A and return light B are collimated, which outputs a measurement value according to an increase or decrease in the distance between the interferometer and the retroreflector 70, wherein the absolute distance L between the interferometer and the retroreflector 70 is estimated by performing arithmetic operation based on an angular position variation ?2 of the two-axis rotating mechanism 40 when a deviation amount d of the return light B from the retroreflector 70 relative to a predetermined position is given as a predetermined value d2.
    Type: Application
    Filed: May 8, 2007
    Publication date: November 22, 2007
    Applicant: MITUTOYO CORPORATION
    Inventors: Shinichi Hara, Naoyuki Taketomi, Makoto Abbe
  • Publication number: 20070024861
    Abstract: A laser tracking interferometer; a carriage rotatable about a center of the reference sphere; a laser interferometer that provides a retroreflector displacement signal, and a displacement gage that provides a displacement signal. A data processing apparatus computes displacement of the retroreflector with respect to the reference sphere. A position sensitive detector provides a position signal corresponding to the amount of deviation of a laser beam when the laser beam is reflected off the retroreflector back into the laser interferometer and deviated in a direction orthogonal to its optical axis. A controller controls rotation of the carriage based on the position signal from the position detector so that the amount of deviation becomes zero.
    Type: Application
    Filed: July 19, 2006
    Publication date: February 1, 2007
    Applicant: MITUTOYO CORPORATION
    Inventors: Shinichirou Yanaka, Makoto Abe, Shinichi Hara, Naoyuki Taketomi