Patents by Inventor Narendra B. Devta-Prasa

Narendra B. Devta-Prasa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit
    Patent number: 8418008
    Abstract: A scan clock modifier, a method of providing a variable scan clock, an IC including a scan clock modifier and a library including a cell of a scan clock modifier. In one embodiment, the scan clock modifier includes: (1) logic circuitry configured to provide at least one selected clock signal based on a test scan clock signal and a first clock control signal, both of the test scan clock signal and the first clock control signal received from test equipment and (2) comparison logic configured to provide a scan clock signal based on the at least one selected clock signal and at least one other clock control signal received from the test equipment, wherein the first and the at least one other clock control signals are different clock control signals.
    Type: Grant
    Filed: December 18, 2008
    Date of Patent: April 9, 2013
    Assignee: LSI Corporation
    Inventors: Sreejit Chakravarty, Narendra B. Devta-Prasa, Arun Gunda, Fan Yang
  • DFT TECHNIQUE TO APPLY A VARIABLE SCAN CLOCK INCLUDING A SCAN CLOCK MODIFIER ON AN IC
    Publication number: 20100162060
    Abstract: A scan clock modifier, a method of providing a variable scan clock, an IC including a scan clock modifier and a library including a cell of a scan clock modifier. In one embodiment, the scan clock modifier includes: (1) logic circuitry configured to provide at least one selected clock signal based on a test scan clock signal and a first clock control signal, both of the test scan clock signal and the first clock control signal received from test equipment and (2) comparison logic configured to provide a scan clock signal based on the at least one selected clock signal and at least one other clock control signal received from the test equipment, wherein the first and the at least one other clock control signals are different clock control signals.
    Type: Application
    Filed: December 18, 2008
    Publication date: June 24, 2010
    Applicant: LSI Corporation
    Inventors: Sreejit Chakravarty, Narendra B. Devta-Prasa, Arun Gunda, Fan Yang