Patents by Inventor NARUMI ATSUTA

NARUMI ATSUTA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11872657
    Abstract: A welding system includes a welding apparatus and an appearance inspection apparatus. The appearance inspection apparatus includes: a shape measurement unit that measures the shape of a weld; an image processor that generates image data based on data of the shape; a determination unit that determines whether the shape of the weld is good or bad based on the image data and a determination model; and a feedback unit that extracts shape defect information if the result of the determination by the determination unit is negative. An output controller of the welding apparatus corrects a welding condition for a workpiece based on the shape defect information extracted by the feedback unit.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: January 16, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Michio Sakurai, Narumi Atsuta, Toru Sakai, Masashi Yoshida
  • Patent number: 11698630
    Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold valu
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: July 11, 2023
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroshi Amano, Narumi Atsuta, Noriaki Hamada, Yosuke Tajika, Nobutaka Kawaguchi, Yuichi Higuchi, Taichi Shimizu
  • Publication number: 20210308782
    Abstract: A welding system includes a welding apparatus and an appearance inspection apparatus. The appearance inspection apparatus includes: a shape measurement unit that measures the shape of a weld; an image processor that generates image data based on data of the shape; a determination unit that determines whether the shape of the weld is good or bad based on the image data and a determination model; and a feedback unit that extracts shape defect information if the result of the determination by the determination unit is negative. An output controller of the welding apparatus corrects a welding condition for a workpiece based on the shape defect information extracted by the feedback unit.
    Type: Application
    Filed: June 21, 2021
    Publication date: October 7, 2021
    Inventors: Michio SAKURAI, Narumi ATSUTA, Toru SAKAI, Masashi YOSHIDA
  • Publication number: 20210264026
    Abstract: An unauthorized communication detection device that detects unauthorized communication in a manufacturing system that manufactures products includes: an obtainer that obtains operation information of the manufacturing system; a storage that stores element information indicating one or more target elements among a plurality of elements related to manufacturing of the products; a specifier that specifies, for each of a plurality of communications performed in the manufacturing system, an element corresponding to the communication, based on the operation information; a calculator that calculates an abnormal degree of each of one or more communications, which satisfy that the element specified by the specifier is included in the one or more target elements indicated by the element information, among the plurality of communications; and a determiner that determines that, when an abnormal degree calculated by the calculator is larger than a threshold value, a communication corresponding to the abnormal degree is th
    Type: Application
    Filed: June 7, 2019
    Publication date: August 26, 2021
    Inventors: Hiroshi AMANO, Narumi ATSUTA, Noriaki HAMADA, Yosuke TAJIKA, Nobutaka KAWAGUCHI, Yuichi HIGUCHI, Taichi SHIMIZU
  • Publication number: 20210208578
    Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold valu
    Type: Application
    Filed: June 7, 2019
    Publication date: July 8, 2021
    Inventors: Hiroshi AMANO, Narumi ATSUTA, Noriaki HAMADA, Yosuke TAJIKA, Nobutaka KAWAGUCHI, Yuichi HIGUCHI, Taichi SHIMIZU
  • Patent number: 10824137
    Abstract: A mounting board manufacturing system includes a component placing device; a library; an operation information counter; and a corrector. The component data includes a control parameter for executing the component placing work by the component placing device, and information regarding the component. The operation information counter counts a score of the component placing work for each component data based on operation information including a result executed by the component placing device. The corrector selects correction component data that is a target to be corrected from a plurality of the component data based on the score and corrects the control parameter of the correction component data.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: November 3, 2020
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Inlin Tan, Takuya Yamazaki, Takaaki Yokoi, Narumi Atsuta, Atsushi Nakazono
  • Publication number: 20180364687
    Abstract: A mounting board manufacturing system includes a component placing device; a library; an operation information counter; and a corrector. The component data includes a control parameter for executing the component placing work by the component placing device, and information regarding the component. The operation information counter counts a score of the component placing work for each component data based on operation information including a result executed by the component placing device. The corrector selects correction component data that is a target to be corrected from a plurality of the component data based on the score and corrects the control parameter of the correction component data.
    Type: Application
    Filed: May 30, 2018
    Publication date: December 20, 2018
    Inventors: INLIN TAN, TAKUYA YAMAZAKI, TAKAAKI YOKOI, NARUMI ATSUTA, ATSUSHI NAKAZONO