Abstract: The vibration characteristic of a dynamic AFM probe is simulated. For a given operation parameter (for example, the displacement u0 of the probe, the spring constant k of the cantilever, or the radius of curvature of the probe R1), the plate-spring cantilever to which the probe is attached is vertically moved while being mechanically resonated, and the vibration characteristic of the probe of the dynamic mode atomic force microscope (AFM) for observing the structure of the sample surface is simulated. The vibration information on the probe in the steady state at each initial position u0 (displacement u?time ?) (S103, S104) is recorded, and the movement of the probe is visualized by GUI on the basis of the recorded vibration information.

Abstract: The vibration characteristic of a dynamic AFM probe is simulated. For a given operation parameter (for example, the displacement u0 of the probe, the spring constant k of the cantilever, or the radius of curvature of the probe R1), the plate-spring cantilever to which the probe is attached is vertically moved while being mechanically resonated, and the vibration characteristic of the probe of the dynamic mode atomic force microscope (AFM) for observing the structure of the sample surface is simulated. The vibration information on the probe in the steady state at each initial position u0 (displacement u?time ?) (S103, S104) is recorded, and the movement of the probe is visualized by GUI on the basis of the recorded vibration information.