Patents by Inventor Nasreen Gazala Chopra
Nasreen Gazala Chopra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7106828Abstract: X-ray imaging systems are provided. A representative x-ray imaging system includes a gas detector that is configured to retain a volume of gas. The gas detector incorporates a first detection circuit corresponding to a first region of the gas and a second detection circuit corresponding to a second region of the gas. The first detection circuit is adapted to provide a first signal indicative of an intensity of x-rays radiating into the first region of the gas and the second detection circuit is adapted to provide a second signal indicative of an intensity of x-rays radiating into the second region of the gas. Methods and other systems also are provided.Type: GrantFiled: November 26, 2001Date of Patent: September 12, 2006Assignee: Agilent Technologies, Inc.Inventors: Nasreen Gazala Chopra, Ronald L. Moon
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Patent number: 6907103Abstract: An imaging system that is capable of capturing images of moving objects as they are moving with minimal blurring by moving a point source of illumination such that the position from which illumination is projected is changed as the object moves to ensure that the position of the image projected onto an imaging plane remains substantially effectively stationary. The position from which illumination is projected functions as a point source of illumination. A image sensor of the imaging system is positioned in the imaging plane and receives illumination projected from the position of the illumination source that passes through the moving object. The image sensor produces electrical signals in response to the received illumination.Type: GrantFiled: June 19, 2002Date of Patent: June 14, 2005Assignee: Agilent Technologies, Inc.Inventors: S. Jeffrey Rosner, Nasreen Gazala Chopra, Ang Shih
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Patent number: 6743737Abstract: A method and apparatus for depositing a low dielectric constant film includes depositing a silicon oxide based film, preferably by reaction of an organosilicon compound and an oxidizing gas at a low RF power level from about 10 W to about 500 W, exposing the silicon oxide based film to water or a hydrophobic-imparting surfactant such as hexamethyldisilazane, and curing the silicon oxide based film at an elevated temperature. Dissociation of the oxidizing gas can be increased in a separate microwave chamber to assist in controlling the carbon content of the deposited film. The moisture resistance of the silicon oxide based films is enhanced.Type: GrantFiled: August 22, 2002Date of Patent: June 1, 2004Assignee: Applied Materials, Inc.Inventors: Wai-Fan Yau, David Cheung, Nasreen Gazala Chopra, Yung-Cheng Lu, Robert Mandal, Farhad Moghadam
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Publication number: 20030235269Abstract: An imaging system that is capable of capturing images of moving objects as they are moving with minimal blurring by moving a point source of illumination such that the position from which illumination is projected is changed as the object moves to ensure that the position of the image projected onto an imaging plane remains substantially effectively stationary. The position from which illumination is projected functions as a point source of illumination. A image sensor of the imaging system is positioned in the imaging plane and receives illumination projected from the position of the illumination source that passes through the moving object. The image sensor produces electrical signals in response to the received illumination.Type: ApplicationFiled: June 19, 2002Publication date: December 25, 2003Inventors: S. Jeffrey Rosner, Nasreen Gazala Chopra, Ang Shih
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Patent number: 6632735Abstract: A method of forming a carbon-doped silicon oxide layer is disclosed. The carbon-doped silicon oxide layer is formed by applying an electric field to a gas mixture comprising an organosilane compound and an oxidizing gas. The carbon-doped silicon oxide layer is compatible with integrated circuit fabrication processes. In one integrated circuit fabrication process, the carbon-doped silicon oxide layer is used as an intermetal dielectric layer. In another integrated circuit fabrication process, the carbon-doped silicon oxide layer is incorporated into a damascene structure.Type: GrantFiled: August 7, 2001Date of Patent: October 14, 2003Assignee: Applied Materials, Inc.Inventors: Wai-Fan Yau, Ju-Hyung Lee, Nasreen Gazala Chopra, Tzu-Fang Huang, David Cheung, Farhad Moghadam, Kuo-Wei Liu, Yung-Cheng Lu, Ralf B. Willecke, Paul Matthews, Dian Sugiarto
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Publication number: 20030108151Abstract: X-ray imaging systems are provided. A representative x-ray imaging system includes a gas detector that is configured to retain a volume of gas. The gas detector incorporates a first detection circuit corresponding to a first region of the gas and a second detection circuit corresponding to a second region of the gas. The first detection circuit is adapted to provide a first signal indicative of an intensity of x-rays radiating into the first region of the gas and the second detection circuit is adapted to provide a second signal indicative of an intensity of x-rays radiating into the second region of the gas. Methods and other systems also are provided.Type: ApplicationFiled: November 26, 2001Publication date: June 12, 2003Inventors: Nasreen Gazala Chopra, Ronald L. Moon
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Publication number: 20030054667Abstract: A method and apparatus for depositing a low dielectric constant film includes depositing a silicon oxide based film, preferably by reaction of an organosilicon compound and an oxidizing gas at a low RF power level from about 10W to about 500W, exposing the silicon oxide based film to water or a hydrophobic-imparting surfactant such as hexamethyldisilazane, and curing the silicon oxide based film at an elevated temperature. Dissociation of the oxidizing gas can be increased in a separate microwave chamber to assist in controlling the carbon content of the deposited film. The moisture resistance of the silicon oxide based films is enhanced.Type: ApplicationFiled: August 22, 2002Publication date: March 20, 2003Applicant: Applied Materials, Inc.Inventors: Wai-Fan Yau, David Cheung, Nasreen Gazala Chopra, Yung-Cheng Lu, Robert Mandal, Farhad Moghadam
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Publication number: 20030032305Abstract: A method of forming a carbon-doped silicon oxide layer is disclosed. The carbon-doped silicon oxide layer is formed by applying an electric field to a gas mixture comprising an organosilane compound and an oxidizing gas. The carbon-doped silicon oxide layer is compatible with integrated circuit fabrication processes. In one integrated circuit fabrication process, the carbon-doped silicon oxide layer is used as an intermetal dielectric layer. In another integrated circuit fabrication process, the carbon-doped silicon oxide layer is incorporated into a damascene structure.Type: ApplicationFiled: August 7, 2001Publication date: February 13, 2003Applicant: Applied Materials, Inc.Inventors: Wai-Fan Yau, Ju-Hyung Lee, Nasreen Gazala Chopra, Tzu-Fang Huang, David Cheung, Farhad Moghadam, Kuo-Wei Liu, Yung-Cheng Lu, Ralf B. Willecke, Paul Matthews, Dian Sugiarto
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Patent number: 6448187Abstract: A method and apparatus for depositing a low dielectric constant film includes depositing a silicon oxide based film, preferably by reaction of an organosilicon compound and an oxidizing gas at a low RF power level from about 10W to about 500W, exposing the silicon oxide based film to water or a hydrophobic-imparting surfactant such as hexamethyldisilazane, and curing the silicon oxide based film at an elevated temperature. Dissociation of the oxidizing gas can be increased in a separate microwave chamber to assist in controlling the carbon content of the deposited film. The moisture resistance of the silicon oxide based films is enhanced.Type: GrantFiled: February 21, 2001Date of Patent: September 10, 2002Assignee: Applied Materials, Inc.Inventors: Wai-Fan Yau, David Cheung, Nasreen Gazala Chopra, Yung-Cheng Lu, Robert Mandal, Farhad Moghadam
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Publication number: 20010026849Abstract: A method and apparatus for depositing a low dielectric constant film includes depositing a silicon oxide based film, preferably by reaction of an organosilicon compound and an oxidizing gas at a low RF power level from about 10W to about 500W, exposing the silicon oxide based film to water or a hydrophobic-imparting surfactant such as hexamethyldisilazane, and curing the silicon oxide based film at an elevated temperature. Dissociation of the oxidizing gas can be increased in a separate microwave chamber to assist in controlling the carbon content of the deposited film. The moisture resistance of the silicon oxide based films is enhanced.Type: ApplicationFiled: February 21, 2001Publication date: October 4, 2001Applicant: Applied Materials, Inc.Inventors: Wai-Fan Yau, David Cheung, Nasreen Gazala Chopra, Yung-Cheng Lu, Robert Mandal, Farhad Moghadam
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Patent number: 6245690Abstract: A method and apparatus for depositing a low dielectric constant film includes depositing a silicon oxide based film, preferably by reaction of an organosilicon compound and an oxidizing gas at a low RF power level from about 10 W to about 500 W, exposing the silicon oxide based film to water or a hydrophobic-imparting surfactant such as hexamethyldisilazane, and curing the silicon oxide based film at an elevated temperature. Dissociation of the oxidizing gas can be increased in a separate microwave chamber to assist in controlling the carbon content of the deposited film. The moisture resistance of the silicon oxide based films is enhanced.Type: GrantFiled: November 4, 1998Date of Patent: June 12, 2001Assignee: Applied Materials, Inc.Inventors: Wai-Fan Yau, David Cheung, Nasreen Gazala Chopra, Yung-Cheng Lu, Robert Mandal, Farhad Moghadam