Patents by Inventor Nassim Zahzam

Nassim Zahzam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10178752
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry, using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. One of these measurement results removes an indeterminacy among several possible values of the external parameter, by taking into account only the other measurement result. A method of this kind can be used to measure a coordinate of a gravitational field or a coordinate of an acceleration of the atoms.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: January 8, 2019
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
    Inventors: Nassim Zahzam, Yannick Bidel, Alexandre Bresson, Alexis Bonnin
  • Patent number: 10153610
    Abstract: A laser source (100) is intended for a device for interacting simultaneously with several atomic species within time intervals which are common to these species. The laser source includes a laser radiation generating set (1), an optical amplifier (2), and a frequency doubler set (3). A component for time-division multiplexing (5) assign in alternation at successive time sub-intervals, initial radiations corresponding to interaction radiations dedicated to different atomic species. The result of the interactions with one of the atomic species is then identical to the result of the interactions with a continuous radiation dedicated to the atomic species.
    Type: Grant
    Filed: July 29, 2015
    Date of Patent: December 11, 2018
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
    Inventors: Yannick Bidel, Nassim Zahzam, Alexandre Bresson
  • Patent number: 10090073
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: October 2, 2018
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
    Inventors: Nassim Zahzam, Yannick Bidel, Alexandre Bresson, Alexis Bonnin
  • Publication number: 20180040388
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
    Type: Application
    Filed: February 10, 2016
    Publication date: February 8, 2018
    Inventors: Nassim ZAHZAM, Yannick BIDEL, Alexandre BRESSON, Alexis BONNIN
  • Publication number: 20180020534
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry, using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. One of these measurement results removes an indeterminacy among several possible values of the external parameter, by taking into account only the other measurement result. A method of this kind can be used to measure a coordinate of a gravitational field or a coordinate of an acceleration of the atoms.
    Type: Application
    Filed: February 10, 2016
    Publication date: January 18, 2018
    Inventors: Nassim ZAHZAM, Yannick BIDEL, Alexandre BRESSON, Alexis BONNIN
  • Publication number: 20170222394
    Abstract: A laser source (100) is intended for a device for interacting simultaneously with several atomic species within time intervals which are common to these species. The laser source includes a laser radiation generating set (1), an optical amplifier (2), and a frequency doubler set (3). A component for time-division multiplexing (5) assign in alternation at successive time sub-intervals, initial radiations corresponding to interaction radiations dedicated to different atomic species. The result of the interactions with one of the atomic species is then identical to the result of the interactions with a continuous radiation dedicated to the atomic species.
    Type: Application
    Filed: July 29, 2015
    Publication date: August 3, 2017
    Inventors: Yannick BIDEL, Nassim ZAHZAM, Alexandre BRESSON
  • Patent number: 9046368
    Abstract: The invention relates to a measurement by means of atom interferometry, using a Raman source that is created by modulating a monochromatic laser source. By conveniently selecting positions in which interactions between atoms and a laser radiation, produced by the Raman source, are caused, it is possible to eliminate or at least reduce a measurement bias caused by supplementary components of the laser radiation. Such a measurement having eliminated or reduced bias can be used in an inertia sensor.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: June 2, 2015
    Assignee: ONERA (Office National D'Etudes et de Recherches Aerospatiales)
    Inventors: Yannick Bidel, Nassim Zahzam, Alexandre Bresson
  • Publication number: 20150090028
    Abstract: An atom interferometer with differential inertial measurement comprises an atom source system to supply several sets of atoms intended for acceleration measurements which are made simultaneously at different respective locations. The sets of atoms are transported by a dedicated system between an initial position and the locations at which the acceleration measurements are made. The interferometer can be used to obtain highly accurate acceleration or gravity gradient measurement results.
    Type: Application
    Filed: March 27, 2013
    Publication date: April 2, 2015
    Applicant: ONERA (Office National d'Etudes et de Recherches Aerospatiales)
    Inventors: Nassim Zahzam, Yannick Bidel, Alexandre Bresson
  • Publication number: 20140319329
    Abstract: The invention relates to a measurement by means of atom interferometry, using a Raman source that is created by modulating a monochromatic laser source. By conveniently selecting positions in which interactions between atoms and a laser radiation, produced by the Raman source, are caused, it is possible to eliminate or at least reduce a measurement bias caused by supplementary components of the laser radiation. Such a measurement having eliminated or reduced bias can be used in an inertia sensor.
    Type: Application
    Filed: December 12, 2012
    Publication date: October 30, 2014
    Inventors: Yannick Bidel, Nassim Zahzam, Alexandre Bresson