Patents by Inventor Nathan Lazarus

Nathan Lazarus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8471304
    Abstract: A method for fabrication of capacitive environment sensors is provided in which the sensor elements are integrated in a CMOS structure with electronics through the use of complementary metal oxide semiconductor (CMOS) fabrication methods. Also provided are environment sensors fabricated, for example, by the method, and a measurement system using the environment sensors fabricated by the method. The described method includes etching away one of the metal layers in a CMOS chip to create a cavity. This cavity is then filled with an environment-sensitive dielectric material to form a sensing capacitor between plates formed by the metal adhesion layers or an array of contacts from other metal layers of the CMOS structure. This approach provides improved sensing capabilities in a system that is easily manufactured.
    Type: Grant
    Filed: June 3, 2011
    Date of Patent: June 25, 2013
    Assignee: Carnegie Mellon University
    Inventors: Gary Fedder, Nathan Lazarus
  • Patent number: 8410562
    Abstract: A capacitive chemical sensor, along with methods of making and using the sensor are provided. The sensors described herein eliminate undesirable capacitance by etching away the substrate underneath the capacitive chemical sensor, eliminating most of the substrate capacitance and making changes in the chemical-sensitive layer capacitance easier to detect.
    Type: Grant
    Filed: January 21, 2011
    Date of Patent: April 2, 2013
    Assignee: Carnegie Mellon University
    Inventors: Nathan Lazarus, Gary Fedder, Sarah Bedair, Chiung Lo
  • Publication number: 20110316054
    Abstract: A method for fabrication of capacitive environment sensors is provided in which the sensor elements are integrated in a CMOS structure with electronics through the use of complementary metal oxide semiconductor (CMOS) fabrication methods. Also provided are environment sensors fabricated, for example, by the method, and a measurement system using the environment sensors fabricated by the method. The described method includes etching away one of the metal layers in a CMOS chip to create a cavity. This cavity is then filled with an environment-sensitive dielectric material to form a sensing capacitor between plates formed by the metal adhesion layers or an array of contacts from other metal layers of the CMOS structure. This approach provides improved sensing capabilities in a system that is easily manufactured.
    Type: Application
    Filed: June 3, 2011
    Publication date: December 29, 2011
    Applicant: Carnegie Mellon University
    Inventors: Gary Fedder, Nathan Lazarus
  • Publication number: 20110180884
    Abstract: A capacitive chemical sensor, along with methods of making and using the sensor are provided. The sensors described herein eliminate undesirable capacitance by etching away the substrate underneath the capacitive chemical sensor, eliminating most of the substrate capacitance and making changes in the chemical-sensitive layer capacitance easier to detect.
    Type: Application
    Filed: January 21, 2011
    Publication date: July 28, 2011
    Inventors: Nathan Lazarus, Gary Fedder, Sarah Bedair, Chiung Lo