Patents by Inventor Nathan OOSTENDORP
Nathan OOSTENDORP has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240089412Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: ApplicationFiled: July 19, 2023Publication date: March 14, 2024Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Anthony Michael OLIVER
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Patent number: 11921014Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: GrantFiled: April 19, 2022Date of Patent: March 5, 2024Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan L. Smith
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Patent number: 11722642Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: GrantFiled: August 23, 2021Date of Patent: August 8, 2023Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Anthony Michael Oliver
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Publication number: 20220397488Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: ApplicationFiled: April 19, 2022Publication date: December 15, 2022Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Ryan L. SMITH
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Patent number: 11340142Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: GrantFiled: September 4, 2020Date of Patent: May 24, 2022Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan L. Smith
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Publication number: 20220086399Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: ApplicationFiled: August 23, 2021Publication date: March 17, 2022Applicant: Sight Machine, Inc.Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Anthony Michael OLIVER
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Publication number: 20210349455Abstract: A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.Type: ApplicationFiled: May 14, 2021Publication date: November 11, 2021Applicant: Sight Machine, Inc.Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Ryan SMITH
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Patent number: 11102455Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: GrantFiled: April 10, 2018Date of Patent: August 24, 2021Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Anthony Michael Oliver
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Publication number: 20210190641Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: ApplicationFiled: September 4, 2020Publication date: June 24, 2021Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Ryan L. SMITH
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Patent number: 11009862Abstract: A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.Type: GrantFiled: November 18, 2019Date of Patent: May 18, 2021Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan Smith
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Patent number: 10768076Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: GrantFiled: October 2, 2017Date of Patent: September 8, 2020Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan L. Smith
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Publication number: 20200233408Abstract: A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.Type: ApplicationFiled: November 18, 2019Publication date: July 23, 2020Applicant: Sight Machine, Inc.Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Ryan SMITH
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Publication number: 20190355112Abstract: A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm.Type: ApplicationFiled: November 19, 2018Publication date: November 21, 2019Inventor: Nathan OOSTENDORP
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Patent number: 10481597Abstract: A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.Type: GrantFiled: December 8, 2016Date of Patent: November 19, 2019Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan Smith
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Publication number: 20190089932Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: ApplicationFiled: April 10, 2018Publication date: March 21, 2019Applicant: Sight Machine, Inc.Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Anthony Michael OLIVER
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Patent number: 10134122Abstract: A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm.Type: GrantFiled: January 13, 2015Date of Patent: November 20, 2018Assignee: SIGHT MACHINE, INC.Inventor: Nathan Oostendorp
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Patent number: 9955123Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.Type: GrantFiled: March 1, 2013Date of Patent: April 24, 2018Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Anthony Michael Oliver
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Publication number: 20170160733Abstract: A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.Type: ApplicationFiled: December 8, 2016Publication date: June 8, 2017Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Ryan SMITH
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Publication number: 20150339812Abstract: A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm.Type: ApplicationFiled: January 13, 2015Publication date: November 26, 2015Inventor: Nathan OOSTENDORP
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Patent number: 8958627Abstract: A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm.Type: GrantFiled: March 14, 2013Date of Patent: February 17, 2015Assignee: Sight Machine, Inc.Inventor: Nathan Oostendorp