Abstract: The agile information technology infrastructure management system and related methods and processes provide a solution with the required flexibility to effectively and efficiently monitor and manage a wide-variety of disparate information technology and network infrastructure deployed in businesses and enterprises throughout a region or the world.

Abstract: The agile information technology infrastructure management system and related methods and processes provide a solution with the required flexibility to effectively and efficiently monitor and manage a wide-variety of disparate information technology and network infrastructure deployed in businesses and enterprises throughout a region or the world.

Abstract: The agile information technology infrastructure management system and related methods and processes provide a solution with the required flexibility to effectively and efficiently monitor and manage a wide-variety of disparate information technology and network infrastructure deployed in businesses and enterprises throughout a region or the world.

Abstract: An apparatus, method, and logic for the synchronized recording and playback of a plurality of media content are described herein. According to an embodiment of the present invention, first and second media content provided by at least one source are selected via a media control device configured to receive and store media content provided from a plurality of sources. Media content and format information of the selected first and second media content are retrieved from the at least one source, and the first and second media content are recorded. A master index is generated to allow synchronous playback of the first and second media content on selected presentation devices.

Abstract: A method for locating electrical short circuits in an electronic substrate containing a plurality of conductive paths. A pair of shorted paths is identified and a current signal is applied thereto. Simultaneously, the voltage across the shorted paths is measured. The current signal is then increased in incremental steps until the voltage starts to vary nonlinearly with respect to the current signal. A temperature differential is then created between the substrate as a whole and small sectors of the substrate until the measured nonlinear relationship between current and voltage reverses in the direction of resuming a linear relationship. The small sector which caused the voltage to respond to the temperature differential is then identified, thereby identifying the approximate location of the short circuit.